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Cryostat RUPIK to SEM for depth profiling of object structure

  • Proceedings of the XXII Russian Conference on Electron Microscopy EM-2008
  • Published:
Bulletin of the Russian Academy of Sciences: Physics Aims and scope


The design features of the cryostat RUPIK to an SEM-100U microscope are described. This cryostat was tested on aqueous suspensions of ground coniferous wood and photographic films. A layer-by-layer SEM study at low temperatures made it possible to perform rapid structural analysis on different portions of these objects.

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Correspondence to A. I. Chemeris.

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Original Russian Text © A.I. Chemeris, V.Yu. Zhovkly, I.I. Chemeris, A.G. Filatova, E.M. Belavtseva, 2009, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2009, Vol. 73, No. 4, pp. 489–491.

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Chemeris, A.I., Zhovkly, V.Y., Chemeris, I.I. et al. Cryostat RUPIK to SEM for depth profiling of object structure. Bull. Russ. Acad. Sci. Phys. 73, 465–467 (2009).

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