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Theoretical and experimental investigation of the influence of external effects on the electronic structure of Ce-based heavy-fermion systems

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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

The electronic structure of Ce systems with different degrees of hybridization of f electrons with outer-shell electrons and the effect of pressure on the change in the electronic structure has been investigated. A correlation between the parameters of X-ray photoelectron spectra and the magnitude of the heavy-fermion state is established. The total and partial densities of states of atoms were calculated using the TB LMTO ASA method. X-ray photoelectron study of the effect of an X-ray induced vacancy in the inner levels on the shape of the Ce3d spectra for Ce-based systems with different degrees of covalence has been performed. It is shown that there is a relationship between the magnitude of the heavy-fermion state and the intensity of the shakedown satellites in X-ray photoelectron spectra and that the magnitude of the heavy-fermion state decreases under pressure.

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Authors and Affiliations

  1. Physicotechnical Institute, Ural Division, Russian Academy of Sciences, ul. Kirova 132, Izhevsk, 426000, Russia

    I. N. Shabanova, A. V. Murin & V. A. Trapeznikov

  2. Udmurt State University, Universitetskaya ul. 1, Izhevsk, 426034, Russia

    E. A. Naimushina

Authors
  1. I. N. Shabanova
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  2. A. V. Murin
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  3. E. A. Naimushina
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  4. V. A. Trapeznikov
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Corresponding author

Correspondence to I. N. Shabanova.

Additional information

Original Russian Text © I.N. Shabanova, A.V. Murin, E.A. Naimushina, V.A. Trapeznikov, 2008, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2008, Vol. 72, No. 4, pp. 474–478.

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Shabanova, I.N., Murin, A.V., Naimushina, E.A. et al. Theoretical and experimental investigation of the influence of external effects on the electronic structure of Ce-based heavy-fermion systems. Bull. Russ. Acad. Sci. Phys. 72, 443–447 (2008). https://doi.org/10.3103/S1062873808040060

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  • DOI: https://doi.org/10.3103/S1062873808040060

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