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The influence of relaxation and nondipole effects on the intensity of X-ray photoelectron spectra

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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

The photoionization cross sections; dipole and nondipole parameters of the angular distribution of photoelectrons; and the spectroscopic factors for the main X-ray photoelectron lines, which are used in quantitative analysis of the surface and most of atoms, have been calculated. It is shown that consideration of nondipole effects leads to a significant (up to 10%) change in the photoelectron angular distribution. Therefore, neglect of nondipole transitions may lead to an error above 10% when MgK α and AlK α X-ray lines are used for surface analysis. Consideration of the spectroscopic factors leads to a decrease in the absolute line intensity by about 20%. Calculations showed that this value weakly depends on the atomic number and quantum shell numbers.

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Correspondence to V. G. Yarzhemsky.

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Original Russian Text © V.I. Nefedov, V.G. Yarzhemsky, M.B. Trzhaskovskaya, 2008, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2008, Vol. 72, No. 4, pp. 454–459.

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Nefedov, V.I., Yarzhemsky, V.G. & Trzhaskovskaya, M.B. The influence of relaxation and nondipole effects on the intensity of X-ray photoelectron spectra. Bull. Russ. Acad. Sci. Phys. 72, 423–428 (2008). https://doi.org/10.3103/S1062873808040011

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