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Sequence of phase formation during solid-state synthesis in Al/Ni films (Al: Ni = 60: 40 at %)

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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

The structure formed during solid-state synthesis in thin bilayer Al/Ni films with the ratio Al: Ni = 60: 40 (at %) has been investigated. The films were obtained by thermal evaporation in vacuum with a residual pressure of 10−5–10−6 Torr. Solid-state synthesis was performed by diffusion reaction. The sequence of phase formation upon vacuum annealing of bilayer Al/Ni films has been established: Al + Ni → Al3Ni + Ni (T ann = 180°C) → Al3Ni2 (T ann = 220°C).

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Authors and Affiliations

  1. Kirensky Institute of Physics, Siberian Division, Russian Academy of Sciences, Akademgorodok, Krasnoyarsk, 660036, Russia

    S. M. Zharkov & K. Yu. Malyshonok

  2. Krasnoyarsk State Technical University, Krasnoyarsk, 660074, Russia

    K. Yu. Malyshonok

Authors
  1. S. M. Zharkov
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  2. K. Yu. Malyshonok
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Additional information

Original Russian Text © S.M. Zharkov, K.Yu. Malyshonok, 2007, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2007, Vol. 71, No. 5, pp. 634–636.

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Zharkov, S.M., Malyshonok, K.Y. Sequence of phase formation during solid-state synthesis in Al/Ni films (Al: Ni = 60: 40 at %). Bull. Russ. Acad. Sci. Phys. 71, 611–613 (2007). https://doi.org/10.3103/S1062873807050048

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  • DOI: https://doi.org/10.3103/S1062873807050048

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