Abstract
Structural transformations in multilayer Ti-Al films (layer thickness from 4 to 500 nm, number of layers up to 4440, total foil thickness ∼18 µm) upon slow heating have been studied by time-resolved synchrotron radiation diffraction. Some specific features of heterogeneous reactions and the sequence of phase formation in multilayer samples during the interaction of interaction between layer components have been determined as functions of the single layer thickness.
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Original Russian Text © I.Yu. Yagubova, A.E. Grigoryan, A.S. Rogachev, M.R. Sharafutdinov, B.P. Tolochko, P.A. Tsygankov, A.N. Nosyrev, 2007, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2007, Vol. 71, No. 2, pp. 278–279.
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Yagubova, I.Y., Grigoryan, A.E., Rogachev, A.S. et al. Dynamics of phase formation in multilayer Ti-Al nanofilms upon heating. Bull. Russ. Acad. Sci. Phys. 71, 270–271 (2007). https://doi.org/10.3103/S1062873807020311
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DOI: https://doi.org/10.3103/S1062873807020311