Abstract
SnO2:xZn thin films (x = 0, 1, 3, 5, 10, 15 wt%) were deposited onto a glass substrate by ultrasonic spray pyrolysis at 350°C and characterized by XRD, UV–VIS spectra, AFM imaging, and texture analysis. All deposited thin films exhibited preferential orientation along the (110) plane. The films were highly transparent (about 80%) in the visible. Upon an increase in x, the band gap energy of the films decreased from 3.7 eV to 3.3 eV.
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Bannur, M.S., Maddani, K.I., Mathad, S.N. et al. Structural and Optical Properties of (110) Plane Textured SnO2:Zn Thin Films. Int. J Self-Propag. High-Temp. Synth. 28, 34–38 (2019). https://doi.org/10.3103/S1061386219010035
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DOI: https://doi.org/10.3103/S1061386219010035