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Near-field microwave tomography of subsurface dielectric layers

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Abstract

There is represented a method of 3D visualization of a structure of dielectric objects with small loss on a basis of data, obtained by scanning with near-field microwave microscope. Theoretical model was proven by means of experimental research of amount of test objects. We researched possibility of probes with complex geometry application for defectoscopy of dielectric materials analysis of volumetric non-uniformities.

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Authors and Affiliations

  1. Taras Shevchenko National University, Kyiv, Ukraine

    Yu. A. Gayday, V. S. Sidorenko & O. V. Sinkevych

Authors
  1. Yu. A. Gayday
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  2. V. S. Sidorenko
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  3. O. V. Sinkevych
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Additional information

Original Russian Text © Yu.A. Gayday, V.S. Sidorenko, O.V. Sinkevych, 2012, published in Izv. Vyssh. Uchebn. Zaved., Radioelektron., 2012, Vol. 55, No. 3, pp. 37–42.

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Gayday, Y.A., Sidorenko, V.S. & Sinkevych, O.V. Near-field microwave tomography of subsurface dielectric layers. Radioelectron.Commun.Syst. 55, 131–135 (2012). https://doi.org/10.3103/S0735272712030041

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  • DOI: https://doi.org/10.3103/S0735272712030041

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