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Extensional Analysis of an Axially Loaded Functionally Graded Piezoelectric Semiconductor Rod with Electrical Nonlinearity

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Abstract

Based on the nonlinear constitutive equations, we investigate an axially loaded functionally graded piezoelectric semiconductor (FGPS) rod. For the FGPS rod with a linear graded distribution of elastic constants along the axial direction, the one-dimensional (1D) nonlinear coupled equations for pure extensional deformation rod with electrical nonlinearity are presented. The classical Newton-Raphson method is used to solve such a nonlinear problem. The multi-field coupling responses of the axially loaded FGPS rod under different initial concentrations of electrons, axial forces, and gradient factors are numerically studied. Numerical results show the gradient factor as well as the initial concentration of electrons has a significant effect on the distribution of each physical field in the FGPS rod, and could be helpful for the development of semiconductor devices with functionally graded piezoelectric semiconductor structures.

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Funding

This work was supported by the Science and Technology Research Project of Henan Province (nos. 232102240061 and 222102320450).

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Authors and Affiliations

  1. Luohe Vocational Technology College, 462000, Luohe, China

    Y. P. Zhao

  2. School of Materials and Energy, University of Electronic Science and Technology of China, 610054, Chengdu, China

    D. Z. Li

  3. Department of Engineering Mechanics, Zhejiang University, 310027, Hangzhou, China

    D. Z. Li

Authors
  1. Y. P. Zhao
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  2. D. Z. Li
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Correspondence to D. Z. Li.

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Zhao, Y.P., Li, D.Z. Extensional Analysis of an Axially Loaded Functionally Graded Piezoelectric Semiconductor Rod with Electrical Nonlinearity. Mech. Solids 58, 1606–1614 (2023). https://doi.org/10.3103/S0025654423600472

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  • DOI: https://doi.org/10.3103/S0025654423600472

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