Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+)
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A trap for positive ions (H+, Cl+, HCl+) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl−, H−) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.
Keywordstime-of-flight mass-spectrometry H− Cl− HCl− ion collisions with surface resonance-enhanced multiphoton ionization
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