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Studying local conductivity in LiNbO3 films via electrostatic force microscopy

  • R. N. ZhukovEmail author
  • S. V. Ksenich
  • I. V. Kubasov
  • N. G. Timushkin
  • A. A. Temirov
  • D. A. Kiselev
  • A. S. Bykov
  • M. D. Malinkovich
  • E. A. Vygovskaya
  • O. V. Toporova
Proceedings of the International Symposium “Physics of Crystals 2013”

Abstract

The distribution of conductivity is studied in nanocristalline lithium niobate thin films via electrostatic force microscopy. Conductivity images are obtained at different bias voltages. Grain boundaries are shown to play a predominant role in the conductivity in lithium niobate thin films.

Keywords

Bias Voltage Lithium Niobate Local Conductivity Electrostatic Force Microscopy Lithium Niobate Single Crystal 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Choi, T., Horibe, Y., Yi, H., et al., Nature Mater., 2010, vol. 9, p. 253.ADSCrossRefGoogle Scholar
  2. 2.
    Kremmer, S., Wurmbauer, H., Teichert, C., et al., J. Appl. Phys., 2005, vol. 97, p. 074315.ADSCrossRefGoogle Scholar
  3. 3.
    Seidel, J., Maksymovych, P., Batra, Y., et al., Phys. Rev. Lett., 2010, vol. 105, p. 197603.ADSCrossRefGoogle Scholar
  4. 4.
    Bharathi, K.K., Lee, W.-M., Sung, J.H., et al., Appl. Phys. Lett., 2013, vol. 102, p. 012908.ADSCrossRefGoogle Scholar
  5. 5.
    Hong, J.W., Noh, K.H., Park, S.-I., et al., Phys. Rev. B, 1998, vol. 58, p. 5078.ADSCrossRefGoogle Scholar
  6. 6.
    Lehnen, P., Dec, J., and Kleemann, W., J. Phys. D: Appl. Phys., 2010, vol. 33, p. 1932.ADSCrossRefGoogle Scholar
  7. 7.
    Kiselev, D.A., Zhukov, R.N., Bykov, A.S., et al., Inorg. Mater, 2014, vol. 50, no. 4, p. 419.CrossRefGoogle Scholar
  8. 8.
    Fujisawa, H., Shimizu, M., Horiuchi, T., et al., Appl. Phys. Lett., 1997, vol. 71, p. 416.ADSCrossRefGoogle Scholar
  9. 9.
    Lazenka, V., Ravinski, A., Makoed, I., et al., J. Appl. Phys., 2012, vol. 111, p. 123916.ADSCrossRefGoogle Scholar

Copyright information

© Allerton Press, Inc. 2014

Authors and Affiliations

  • R. N. Zhukov
    • 1
    Email author
  • S. V. Ksenich
    • 1
  • I. V. Kubasov
    • 1
  • N. G. Timushkin
    • 1
  • A. A. Temirov
    • 1
  • D. A. Kiselev
    • 1
  • A. S. Bykov
    • 1
  • M. D. Malinkovich
    • 1
  • E. A. Vygovskaya
    • 1
  • O. V. Toporova
    • 1
  1. 1.National University of Science and Technology “MISIS”MoscowRussia

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