Skip to main content
SpringerLink
Log in

Structural, morphology and electrical properties of layered copper selenide thin film

  • Research Article
  • Published:
Central European Journal of Physics

Abstract

Thin films of copper selenide (CuSe) were physically deposited layer-by-layer up to 5 layers using thermal evaporation technique onto a glass substrate. Various film properties, including the thickness, structure, morphology, surface roughness, average grain size and electrical conductivity are studied and discussed. These properties are characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), ellipsometer and 4 point probe at room temperature. The dependence of electrical conductivity, surface roughness, and average grain size on number of layers deposited is discussed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. S. Y. Zhang et al., Cryst. Growth Des. 6, 2809 (2006)

    Article  Google Scholar 

  2. S. T. Lakshmikumar, A. C. Rastogi, Sol. Energ. Mat. Sol. C. 32, 7 (1994)

    Article  Google Scholar 

  3. W. S. Chen, J. M. Stewart, R. A. Mickelsen, Appl. Phys. Lett. 46, 1095 (1985)

    Article  ADS  Google Scholar 

  4. C. Levy-Clement, M. Neumann-Spallart, S. K. Haram, K. S. V. Santhanam, Thin Solid Films 302, 12 (1997)

    Article  ADS  Google Scholar 

  5. V. M. Bhuse, P. P. Hankare, K. M. Garadkar, A. S. Khomane, Mater. Chem. Phys. 80, 82 (2003)

    Article  Google Scholar 

  6. S. R. Gosavi, N. G. Deshpande, Y. G. Gudage, R. Sharma, J. Alloy Compd. 448, 344 (2008)

    Article  Google Scholar 

  7. D. Lippkow, H. H. Strehblow, Electrochim. Acta 43, 2131 (1998)

    Article  Google Scholar 

  8. H. M. Pathan, C. D. Lokhande, D. P. Amalnerkar, T. Seth, Appl. Surf. Sci. 211, 48 (2003)

    Article  ADS  Google Scholar 

  9. R. Cordova et al., J. Phys. Chem. B 109, 3212 (2005)

    Google Scholar 

  10. V. Saltas et al., Surf. Rev. Lett. 7, 235 (2000)

    Google Scholar 

  11. Al-Mamun, A. B. M. O. Islam, Int. J. Mod. Phys. B 18, 3063 (2004)

    Article  ADS  Google Scholar 

  12. Al-Mamun, A. B. M. O. Islam, A. H. Bhuiyan, J. Mater. Sci.-Mater. El. 16, 263 (2005)

    Article  Google Scholar 

  13. E. Andrade et al., Nucl. Instrum. Meth. B 161-163,635 (2000)

    Article  ADS  Google Scholar 

  14. R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light (North-Holland, Amsterdam, 1997)

    Google Scholar 

  15. H. G. Tompkins, A user’s guide to ellipsometry (Academic Press, Boston, 1993)

    Google Scholar 

  16. L. B. Valdes, Proceedings of the IRE 42, 420 (1954)

    Article  Google Scholar 

  17. S. Agilan, D. Mangalaraj, S. K. Narayandass, G. Mohan Rao, Physica B 365, 93 (2005)

    Article  ADS  Google Scholar 

  18. J. M. Pawlikowski, Thin Solid Films 127, 29 (1985)

    Article  ADS  Google Scholar 

  19. E. E. Khawaja, J. Phys. D Appl. Phys. 9, 1939 (1976)

    Article  ADS  Google Scholar 

  20. J. C. Manifacier, J. Gasiot, P. Fillard, J. Phys. E Sci. Instrum. 9, 1002 (1976)

    Article  ADS  Google Scholar 

  21. R. S. Mane, B. R. Sankapal, C. D. Lokhande, Mater. Chem. Phys. 64, 215 (2000)

    Article  Google Scholar 

  22. Z. J. Liu and Y. G. Shen, Appl. Phys. Lett. 84, 5121 (2004)

    Article  ADS  Google Scholar 

  23. L. Y. Huang, L. Meng, Mat. Sci. Eng. B.-Solid 137, 310 (2007)

    Article  Google Scholar 

  24. P. G. Ganesan, V. D. Das, Mater. Lett. 60, 2059 (2006)

    Article  Google Scholar 

  25. J. Y. W. Seto, J. Appl. Phys. 46, 5247 (1975)

    Article  ADS  Google Scholar 

  26. S. S. Lin, J. L. Huang, D. F. Lii, Surf. Coat. Tech. 190, 372 (2005)

    Article  Google Scholar 

  27. S. Christoulakis et al., Appl. Surf. Sci. 252, 5351 (2006)

    Article  ADS  Google Scholar 

  28. M. Lakshmi et al., Thin Solid Films 386, 127 (2001)

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia

    J. Ying Chyi Liew, Zainal A. Talib, W. Mahmood, M. Yunus, Zulkarnain Zainal, Shaari A. Halim, Mohd M. Moksin, Wan Mohd Yusoff & K. Pah Lim

Authors
  1. J. Ying Chyi Liew
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Zainal A. Talib
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. W. Mahmood
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. M. Yunus
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Zulkarnain Zainal
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. Shaari A. Halim
    View author publications

    You can also search for this author in PubMed Google Scholar

  7. Mohd M. Moksin
    View author publications

    You can also search for this author in PubMed Google Scholar

  8. Wan Mohd Yusoff
    View author publications

    You can also search for this author in PubMed Google Scholar

  9. K. Pah Lim
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Zainal A. Talib.

About this article

Cite this article

Ying Chyi Liew, J., Talib, Z.A., Mahmood, W. et al. Structural, morphology and electrical properties of layered copper selenide thin film. centr.eur.j.phys. 7, 379–384 (2009). https://doi.org/10.2478/s11534-009-0057-1

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.2478/s11534-009-0057-1

Keywords

PACS (2008)

Search

Navigation