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Analysis of Signal to Background Ratio in Synchrotron Radiation X-Ray Fluorescence

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Abstract

The signal to background (S/B) ratio in energy dispersive X-ray fluorescence using synchrotron radiation (SR) was quantitatively analyzed. The S/B ratio, which has been significantly improved by taking advantage of the polarized nature of SR, was found to be strongly dependent on geometrical factors of the measurement system. From the analysis on the origin of the scattered background, the dependence of the S/B ratio on the geometry was quantitatively explained, mainly by the polarization properties of SR. Experimental conditions could be optimized by adjusting the degree of polarization of the incident beam and the detector solid angle.

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Authors and Affiliations

  1. Department of Industrial Chemistry, Faculty of Engineering, The University of Tokyo, Hongo, Tokyo, 113, Japan

    Kenji Sakurai & Yohichi Gohshi

  2. Photon Factory, National Laboratory for High Energy Physics, Tsukuba, Ibaraki, 305, Japan

    Atsuo Iida

Authors
  1. Kenji Sakurai
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  2. Atsuo Iida
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  3. Yohichi Gohshi
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Sakurai, K., Iida, A. & Gohshi, Y. Analysis of Signal to Background Ratio in Synchrotron Radiation X-Ray Fluorescence. ANAL. SCI. 4, 3–7 (1988). https://doi.org/10.2116/analsci.4.3

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  • DOI: https://doi.org/10.2116/analsci.4.3

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