Abstract
Lifetime-broadening-suppressed (LBS) state-selective XAFS spectra can be deduced by analyzing resonant inelastic x-ray scattering (RIXS) in terms of formulae derived from the Kramers-Heisenberg equation. By a combination of third-generation synchrotron sources and spectrometers equipped with a large acceptance as well as high-resolution analyzers, high-quality RIXS data to extract LBS selective XAFS can be collected. In this review, basic aspects of this novel technique are described, and its potentiality as an analytical tool to determine the local electronic and magnetic structures of metal atoms is demonstrated with several recent examples.
This is a preview of subscription content, access via your institution.
6 References
B. K. Teo and D. C. Joy, “EXAFS Spectroscopy. Techniques and Applications.”, 1981, Plenum Press, New York.
J. J. Rehr and R. C. Albers, Rev. Mod. Phys., 2000, 72, 621.
T. K. Sham, “Chemical Applications of Synchrotron Radiation. Part II: X-ray Applications.”, 2002, World Scientific, Singapore.
M. O. Krause and J. H. Oliver, J. Phys. Chem. Ref. Data. 1979, 8, 329.
K. Hamalainen, D. P. Siddons, J. B. Hastings, and L. E. Berman, Phys. Rev. Lett., 1991, 67, 2850.
A. Kotani and S. Shin, Rev. Mod. Phys., 2001, 73, 203.
F. de Groot, Chem. Rev., 2001, 101, 1779.
H. Hayashi, R. Takada, Y. Udagawa, T. Nakamura, H. Miyagawa, H. Shoji, S. Nanao, and N. Kawamura, Phys. Rev. B. 2003, 68, 45122.
H. Hayashi, M. Kawata, Y. Udagawa, N. Kawamura, and S. Nanao, Phys. Rev. B. 2004, 70, 134427.
H. Hayashi, R. Takeda, M. Kawata, Y. Udagawa, N. Kawamura, Y. Watanabe, and S. Nanao, Phys. Rev. B. 2004, 70, 155113.
H. Hayashi, M. Kawata, R. Takeda, A. Sato, Y. Udagawa, N. Kawamura, and S. Nanao, J. Phys. Chem. Solids. 2005, 66, 2168.
P. Glatzel and U. Bergmann, Coord. Chem. Rev., 2005, 249, 65.
U. Bergmann and S. P. Cramer, SPIE Proc., 1998, 3448, 198.
H. Hayashi, M. Kawata, R. Takeda, Y. Udagawa, Y. Watanabe, T. Takano, S. Nanao, and N. Kawamura, J. Electron Spectrosc. Relat. Phenom., 2004, 136, 191.
H. Hayashi, AIP Conference Proceedings. 2007, 882, 833.
P. Carra, M. Fabrizio, and B. T. Thole, Phys. Rev. Lett., 1995, 74, 3700.
P. W. Loeffen, R. F. Pettifer, S. Mullender, M. A. van Veenendaal, J. Rohler, and D. S. Sivia, Phys. Rev. B. 1996, 54, 14877.
S. Tanaka, K. Okada, and A. Kotani, J. Phys. Soc. Jpn. B. 1994, 63, 2780.
F. M. F. de Groot, M. H. Krisch, and J. Vogel, Phys. Rev. B. 2002, 66, 195112.
J. Tulkki and T. Aberg, J. Phys. B: At., Mol. Opt., Phys., 1982, 15, L435.
P. Suortti, V. Etelaniemi, K. Hamalainen, and S. Manninen, J. Phys. (Paris), Colloq., 1987, 48, C9–831.
V. Etelaniemi, K. Hamalainen, S. Manninen, and P. Suortti, J. Phys. Condens. Matter. 1992, 4, 879.
H. Hayashi, Y. Udagawa, W. A. Caliebe, and C.-C. Kao, Chem. Phys. Lett., 2003, 371, 125.
H. Hayashi, M. Kawata, A. Sato, Y. Udagawa, T. Inami, K. Ishii, H. Ogasawara, and S. Nanao, Phys. Rev. B. 2005, 72, 045114.
H. Hayashi, R. Takeda, M. Kawata, Y. Udagawa, Y. Watanabe, T. Takano, S. Nanao, N. Kawamura, T. Uefuji, and K. Yamada, J. Electron Spectrosc. Relat. Phenom., 2004, 136, 199.
H. Hayashi, T. Azumi, A. Sato, R. Takeda, M. Kawata, Y. Udagawa, N. Kawamura, K. Yamada, and K. Ikeuchi, Radiat. Phys. Chem., 2006, 75, 1586.
A. Kotani, Eur. Phys. J. B. 2005, 47, 3.
H. Hayashi, Y. Udagawa, and C.-C. Kao, J. Electron Spectrosc. Relat. Phenom., 2004, 137–140. 277.
N. Kosugi, H. Kondoh, H. Tajima, and H. Kuroda, Chem. Phys., 1989, 135, 149.
N. L. Saini, A. Lanzara, H. Oyanagi, H. Yamaguchi, K. Oka, T. Ito, and A. Bianconi, Phys. Rev. B. 1997, 55, 12759.
C. Concha, J. Garcia, J. Blasco, K. B. Garg, R. K. Singhal, and D. Chaturvedi, Int. J. Mod. Phys. B. 2002, 16, 1327.
G. Peng, X. Wang, C. R. Randall, J. A. Moore, and S. P. Cramer, Appl. Phys. Lett., 1994, 65, 2527.
K. Hamalainen, C.-C. Kao, J. B. Hastings, D. P. Siddons, L. E. Berman, V. Stojanoff, and S. P. Cramer, Phys. Rev. B. 1992, 46, 14274.
F. M. F. de Groot, S. Pizzini, A. Fontaine, K. Hamalainen, C.-C. Kao, and J. B. Hastings, Phys. Rev. B. 1995, 51, 1045.
Q. Qian, T. A. Tyson, C.-C. Kao, M. Croft, and A. Yu. Ignatov, Appl. Phys. Lett., 2002, 80, 3141.
Q. Qian, T. A. Tyson, S. Savrassov, C.-C. Kao, and M. Croft, Phys. Rev. B. 2003, 68, 014429.
X. Wang, F. M. F. de Groot, and S. P. Cramer, Phys. Rev. B. 1997, 56, 4553.
A. V. Soldatov, T. S. Ivanchenko, A. P. Kovtun, S. D. Longa, and A. Bianconi, Phys. Rev. B. 1995, 52, 11757.
H. Hayashi, A. Sato, T. Azumi, Y. Udagawa, T. Inami, K. Ishii, and K. B. Garg, Phys. Rev. B. 2006, 73, 134405.
C. Suzuki, J. Kawai, H. Adachi, and T. Mukoyama, Chem. Phys., 1999, 247, 453.
H. Hayashi, A. Sato, and Y. Udagawa, Adv. X-ray Chem. Anal. Japan.(in Japanese), 2006, 37, 311.
I. Topol, J. Tilgner, G. Leonhardt, and A. Meisel, J. Phys. Chem. Solids. 1974, 35, 1657.
G. Drager, W. Czolbe, E. Schulz, A. Simunek, J. Drahokoupil, Yu. N. Kucherenko, and V. V. Nemoshkalenko, Phys. Status Solidi. 1985, 131, 193.
L.-J. Lai, T.-C. Chu, Y.-C. Hsu, and Y.-H. Chen, J. Appl. Phys., 2005, 97, 113524.
M. Ishii, A. Nakao, and T. Uchihashi, Phys. Scr., 2005, T115. 97.
W. A. Caliebe, Q. Qian, T. A. Tyson, A. Deyhim, B. Blank, and C.-C. Kao, AIP Conference Proceedings. 2004, 705, 893.
F. Gelebart, M. Morand, Q. Dermigny, P. Giura, J.-P. Rueff, and A. Shukla, AIP Conference Proceedings. 2007, 879, 1837.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Hayashi, H. Lifetime-Broadening-Suppressed Selective XAFS Spectroscopy. ANAL. SCI. 24, 15–23 (2008). https://doi.org/10.2116/analsci.24.15
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.2116/analsci.24.15