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Silicon to Aluminum Ratios of Zeolites by X-Ray Photoelectron Spectroscopy with Argon-ion Etching

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References

  1. Characterization of Zeolite II (Characterization of Zeolites I: “Chemical Structural Analysis of Y-Zeolites and Mordenites by High-Resolution Solid-State NMR”, S. Nakata, S. Asaoka and H. Takahashi, Nippon Kagaku Kaishi, 1985, 1372.).

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  2. V. Anděra, L. Kubelková, J. Nováková, B. Wichterlová and S. Bednářova, Zeolites, 5, 67 (1985).

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  3. Th. Gross, U. Lohse, G. Engelhardt, K.-H. Richter and V. Patzelová, Zeolites, 4, 25 (1984).

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  4. Shokubai, 2d, (3), 6 (1984).

  5. S. Nakata, S. Asaoka and H. Takahashi, Nippon Kagaku Kaishi, 1985, 1372.

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Authors and Affiliations

  1. R&D Center, Chiyoda Chemical Engineering & Construction Co., Ltd., Moriyacho, Kanagawa-ku, Yokohama, 221, Japan

    Shin-ichi Nakata, Kohji Nagaoka, Sachio Asaoka & Hiromitsu Takahashi

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  1. Shin-ichi Nakata
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  2. Kohji Nagaoka
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  3. Sachio Asaoka
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  4. Hiromitsu Takahashi
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Nakata, Si., Nagaoka, K., Asaoka, S. et al. Silicon to Aluminum Ratios of Zeolites by X-Ray Photoelectron Spectroscopy with Argon-ion Etching. ANAL. SCI. 2, 95–96 (1986). https://doi.org/10.2116/analsci.2.95

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  • DOI: https://doi.org/10.2116/analsci.2.95

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