Abstract
This study proposes a recoverable stress testing algorithm (RSTA) for such special devices as compression/decompression card and encryption/decryption card. It uses a chaos function to generate a random sequence, and then, according to the random sequence, generates an effective command sequence. The dispatch of command obeys a special schedule strategy we designed for such devices, i.e., the commands are sent according to the command sequence, and the complete commands are put in a buffer for further result check. RSTA is used to test the HIFN compression acceleration card SAICHI-1000. Test results show that RSTA can make the card work continuously and adequately.
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References
Barber, J.S., Gehner, K.R., 1992. Age-and-test procedures for true reliability improvement, feasibility and economic justification. IIE Trans., 24(5):81–87. [doi:10.1080/07408179208964247]
Bose, R., Banerjee, A., 1999. Implementing Symmetric Cryptography Using Chaos Functions. Proc. 7th Int. Conf. Advanced Computing and Communications, p.318–321.
Chan, H.A., 1995. The benefits of stress testing. IEEE Trans. on Comp., Pack., Manuf. Technol., Part A, 18(1):23–29. [doi:10.1109/95.370730]
Chan, H.A., 2004. Accelerated Stress Testing for both Hardware and Software. Proc. Annual Reliability and Maintainability Symp., p.346–351. [doi:10.1109/RAMS.2004.1285473]
Cui, Y., Xu, K., Xu, M.W., Wu, J.P., 2002. Stress Testing of OSPF Protocol Implementation Based on Large-scale Routing Simulation. Proc. 10th IEEE Int. Conf. on Networks, p.63–68. [doi:10.1109/ICON.2002.1033290]
Cui, Y., Xu, K., Xu, M.W., Wu, J.P., 2003. Internet Routing Emulation System and Stress Testing. Proc. 10th Int. Conf. on Telecommunications, 2:1020–1026. [doi:10.1109/ICTEL.2003.1191578]
Elbert, M., Mpagazehe, C., Weyant, T., 1994. Stress Testing and Reliability. Conf. Record, Southcon’94, p.357–362. [doi:10.1109/SOUTHC.1994.498132]
Gullo, L.J., Davis, R.J., 2004. Accelerated Stress Testing to Detect Probabilistic Software Failures. Proc. Annual Reliability and Maintainability Symp., p.249–255. [doi:10.1109/RAMS.2004.1285456]
Hobbs, G.K., 1987. Development of Stress Screens. Proc. Annual Reliability and Maintainability Symp., p.115–118.
Hobbs, G.K., 1992. Highly Accelerated Stress Screens—HASS. National Electronic Packaging and Production Conf.-Proc. Technical Program. Cahner Exposition Group, Des Plaines, IL, USA, p.1565–1572.
Liu, L., Lin, J., Li, Z.T., Li, J.C., 2006. State Machine Based CDMA Stress Testing Service System. Asia-Pacific Services Computing Conf., South China University of Technology, Guangzhou, China, p.625–628.
McLinn, J.A., 1998. Ways to Improve the Analysis of Step-stress Testing. Proc. Annual Reliability and Maintainability Symp., p.358–364. [doi:10.1109/RAMS.1998.653804]
Pachucki, D.E., 1994. Environmental Stress Screening Experiment Using Taguchi Method. Proc. 43rd Electronic Components and Technology Conf.. IEEE Computer Society, New York, p.1028–1036.
Roy, K., Roy, R.K., Chatterjee, A., 1995. Stress Testing of Combinational VLSI Circuits Using Existing Test Sets. VLSI Technology. Proc. Technical Papers, Int. Symp. on VLSI Technology Systems and Applications, p.93–98. [doi:10.1109/VTSA.1995.524640]
Shinner, C., 1988. The board electronic STRIFE test (B.E.S.T.) program. Am. Soc. Qual. Control Rel. Rev., p.3–6.
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Project supported by the Hi-Tech Research and Development Program (863) of China (No. 2006AA01Z431) and the Giant Project of Zhejiang Province, China (No. 2006C11105)
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Zhang, Bj., Pan, Xz., Wang, Jb. et al. A recoverable stress testing algorithm for compression and encryption cards. J. Zhejiang Univ. Sci. A 9, 1398–1405 (2008). https://doi.org/10.1631/jzus.A0720130
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DOI: https://doi.org/10.1631/jzus.A0720130