Abstract
Non-volatile random-access memory (NVRAM) technology is maturing rapidly and its byte-persistence feature allows the design of new and efficient fault tolerance mechanisms. In this paper we propose the versionized process (VerP), a new process model based on NVRAM that is natively non-volatile and fault tolerant. We introduce an intermediate software layer that allows us to run a process directly on NVRAM and to put all the process states into NVRAM, and then propose a mechanism to versionize all the process data. Each piece of the process data is given a special version number, which increases with the modification of that piece of data. The version number can effectively help us trace the modification of any data and recover it to a consistent state after a system crash. Compared with traditional checkpoint methods, our work can achieve fine-grained fault tolerance at very little cost.
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Project supported by the National High-Tech R&D Program (863) of China (Nos. 2012AA01A301, 2012AA010901, 2012AA010303, and 2015AA01A301), the Program for New Century Excellent Talents in University, the National Natural Science Foundation of China (Nos. 61272142, 61402492, 61402486, 61379146, and 61272483), the Laboratory Pre-research Fund (No. 9140C810106150C81001), and the Open Project of the State Key Laboratory of High-End Server & Storage Technology (No. 2014HSSA01)
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Zhang, Wz., Lu, K. & Wang, Xp. Versionized process based on non-volatile random-access memory for fine-grained fault tolerance. Frontiers Inf Technol Electronic Eng 19, 192–205 (2018). https://doi.org/10.1631/FITEE.1601477
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DOI: https://doi.org/10.1631/FITEE.1601477