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Inversion of thicknesses of multi-layered structures from eddy current testing measurements

  • Advanced Manufacturing Engineering
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Abstract

Luquireet al., 's impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.

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Authors and Affiliations

  1. Institute of Advanced Manufacturing engineering, Zhejiang University, 310027, Hangzhou, China

    Huang Ping-jie & Wu Zhao-tong

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  1. Huang Ping-jie
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  2. Wu Zhao-tong
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Ping-jie, H., Zhao-tong, W. Inversion of thicknesses of multi-layered structures from eddy current testing measurements. J. Zheijang Univ.-Sci. 5, 86–91 (2004). https://doi.org/10.1631/BF02839318

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  • DOI: https://doi.org/10.1631/BF02839318

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