We show a systematic correlation between temperature, critical current density (CCD), and ASR. The ASR declines while the CCD increases with temperature. The behavior is consistent with a void nucleation model for cell failure. Void nucleation is driven by the cell voltage: a lower ASR reduces the voltage which helps to raise the critical current density. The voids are postulated to be precipitated by local concentrations of electrochemical currents which pull lithium into the electrolyte leaving behind a void in the lithium layer across from the interface. We also report on a possible method for reducing the non-uniformity of current flow across the interface by introducing a layer of silver at the interface. It has the effect of increasing the CCD to 3.5 mA cm−2 at elevated temperature.
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This research was supported by a project from ARPA-E award Number DE-AR0000777.
Conflict of interest
On behalf of all authors, the corresponding author states that there is no conflict of interest. We do need to inform that a non-provisional patent based on the work on silver interlayer is currently being examined at the US Patent and Trademark Office.
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Clemenceau, T., Andriamady, N. & Raj, R. Influence of temperature and ASR on the critical current density in lithium-metal–ceramic cells. MRS Communications 11, 483–488 (2021). https://doi.org/10.1557/s43579-021-00059-3
- X-ray tomography