Abstract
The results of SPM-based localized electrical examination of precipitation hardened Waspaloy microstructures using Electrostatic Force Microscopy (EFM) and Current-Atomic Force Microscopy (I-AFM) are reported herein. The measurements were conducted on two differently etched specimens with the same initial microstructure. Selective etching by preferentially removing the ?’ or the ? phase resulted in a non-uniform surface topography leaving the less reactive phase standing in relief relative to the depressed phase. The presence of a non-uniform surface topography affected the measured EFM response by causing an inhomogeneous surface voltage distribution. A non-linear tip-surface interaction could have further complicated the measured EFM response by making it non-localized. The EFM phase obeyed a supplementary behavior upon reversing the polarity of the DC bias. Using I-AFM, the tip current was found to be the highest at ?-?’ interphase boundaries, which was attributed to the relaxation of the lattice atoms in the relief zone formed upon etching.
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Siva Kumar, V., Kelekanjeri, G. & Gerhardt, R.A. SPM-based Electrical Characterization of Aged Waspaloy Microstructures. MRS Online Proceedings Library 1025, 1310 (2007). https://doi.org/10.1557/PROC-1025-B13-10
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DOI: https://doi.org/10.1557/PROC-1025-B13-10