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Extending AFM Phase Image of Nanocomposite Structures to 3D using FIB

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Abstract

The mechanical behavior of nanocomposites is critically dependent on their structural composition. In this paper we use Focused Ion Beam (FIB) microscopy to prepare surfaces from a layered polymer nanocomposite for investigation using phase contrast atomic force microscopy (AFM). Phase contrast AFM provides mechanical information on the surface examined and, by combining with the sequential cross-sectioning of FIB, can extend the phase contract AFM into three dimensions.

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Acknowledgments

The authors would like to thank Dr Zofia Luklinska at the NanoVision Centre, Queen Mary University of London for support on the electron microscopes. RJB was supported through this work by the EPSRC (UK) and the FEI Company.

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Authors and Affiliations

  1. Department of Materials, School of Engineering & Materials Science, Queen Mary University of London, London, E1 4NS, United Kingdom

    Russell J. Bailey & Asa H. Barber

  2. FEI Company, 5651 GG, Eindhoven, Netherlands

    Remco Geurts, Debbie J. Stokes & Frank de Jong

Authors
  1. Russell J. Bailey
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  2. Remco Geurts
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  3. Debbie J. Stokes
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  4. Frank de Jong
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  5. Asa H. Barber
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Bailey, R.J., Geurts, R., Stokes, D.J. et al. Extending AFM Phase Image of Nanocomposite Structures to 3D using FIB. MRS Online Proceedings Library 1421, 53–57 (2012). https://doi.org/10.1557/opl.2012.433

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  • DOI: https://doi.org/10.1557/opl.2012.433

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