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In situ TEM nanomechanics

  • Frontiers of in situ electron microscopy
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Abstract

In situ transmission electron microscopy (TEM) nanomechanical testing has benefited from a number of recent technical developments related to both how deformation is imaged and how deformation is induced and measured inside a TEM instrument. These developments have led to new insights into the deformation mechanisms of a wide range of metals and alloys, as well as measurements of the unusual mechanical properties of small-scale objects such as whiskers and nanocrystals. Herein, we describe this recent progress through selected highlights of recent findings on the dynamic behavior of defects such as dislocations, twins, and grain boundaries.

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Acknowledgements

A.M.M. was supported by the Molecular Foundry at Lawrence Berkeley National Laboratory, which is supported by the US Department of Energy under Contract DE-AC02-05CH11231. M.L. was supported by the French National Research Agency under the “Investissement d’Avenir” MIMETIS program (reference ANR-10-EQPX-38-01).

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Authors and Affiliations

  1. Center of Electron Microscopy and State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, China

    Q. Yu

  2. Centre d’Elaboration des Matériaux et d’Etudes Structurales, Centre National de la Recherche Scientifique, France

    M. Legros

  3. Department of Materials Science and Engineering, University of California–Berkeley, and Lawrence Berkeley National Laboratory, USA

    A. M. Minor

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Yu, Q., Legros, M. & Minor, A.M. In situ TEM nanomechanics. MRS Bulletin 40, 62–70 (2015). https://doi.org/10.1557/mrs.2014.306

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