Abstract
Trapped ions are sensitive to electric-field noise from trap-electrode surfaces. This noise has been an obstacle to progress in trapped-ion quantum information processing (QIP) experiments for more than a decade. It causes motional heating of the ions, and thus quantum-state decoherence. This heating is anomalous because it is not easily explained by typical technical-noise sources. Experimental evidence of its dependence on ion-electrode distance, frequency, and electrode temperature points to the surface, rather than the bulk, of the trap electrodes as the origin. In this article, we review experimental efforts and models to help identify and reduce or eliminate the source of the anomalous heating. Recent progress to reduce the heating with in situ cleaning indicates that it may not be a fundamental limit to trapped-ion QIP. Moreover, the extreme sensitivity of trapped ions to electric-field noise may potentially be used as a new tool in surface science.





Similar content being viewed by others
References
J.I. Cirac, P. Zoller, Phys. Rev. Lett. 74, 4091 (1995).
R. Blatt, D.J. Wineland, Nature 453, 1008 (2008).
R. Blatt, C.F. Roos, Nat. Phys. 8, 277 (2012).
C. Monroe, J. Kim, Science 339, 1164 (2013).
D.P. DiVincenzo, Fortschr. Phys. 48, 771 (2000).
D.J. Wineland, C. Monroe, W.M. Itano, D. Leibfried, B.E. King, D.M. Meekhof, J. Res. Nat. Inst. Stand. Technol. 103, 259 (1998).
J. Preskill, Proc. R. Soc. London, Ser. A 454, 385 (1998).
A. Sørensen, K. Mølmer, Phys. Rev. A 62, 022311 (2000).
E. Knill, Nature 463, 441 (2010).
Q.A. Turchette, D. Kielpinski, B.E. King, D. Leibfried, D.M. Meekhof, C.J. Myatt, M.A. Rowe, C.A. Sackett, C.S. Wood, W.M. Itano, C. Monroe, D.J. Wineland, Phys. Rev. A. 61 063418 (2000).
A. Safavi-Naini, P. Rabl, P.F. Weck, H.R. Sadeghpour, Phys. Rev. A 84, 023412 (2011).
N. Daniilidis, S. Narayanan, S.A. Möller, R. Clark, T.E. Lee, P.J. Leek, A. Wallraff, St. Schulz, F. Schmidt-Kaler, H. Häffner, New J. Phys. 13, 013032 (2011).
F. Diedrich, J.C. Bergquist, W.M. Itano, D.J. Wineland, Phys. Rev. Lett. 62, 403 (1989).
C. Monroe, D.M. Meekhof, B.E. King, W.M. Itano, D.J. Wineland, Phys. Rev. Lett. 75, 4714 (1995).
A. van der Ziel, Adv. Electron. El. Phys. 49, 225 (1979).
G.W. Timm, A. van der Ziel, Physica 32, 1333 (1966).
Ch. Kleint, Surf. Sci. 200, 472 (1988).
R. Gomer, Rep. Prog. Phys. 53, 917 (1990).
M.A. Gesley, L.W. Swanson, Phys. Rev. B 32, 7703 (1985).
M. Gesley, L. Swanson, Phys. Rev. A 37, 4879 (1988).
A. Safavi-Naini, E. Kim, P.F. Weck, P. Rabl, H.R. Sadeghpour, Phys. Rev. A 87, 023421 (2013).
L. Faoro, L.B. Ioffe, Phys. Rev. Lett. 96, 047001 (2006).
J.B. Pendry, P.D. Kirkman, E. Castano, Phys. Rev. Lett. 57, 2983 (1986).
H.M. Benia, P. Myrach, A. Gonchar, T. Risse, N. Nilius, H.J. Freund, Phys. Rev. B 81, 241415 (2010).
S. Seidelin, J. Chiaverini, R. Reichle, J.J. Bollinger, D. Leibfried, J. Britton, J.H. Wesenberg, R.B. Blakestad, R.J. Epstein, D.B. Hume, W.M. Itano, J.D. Jost, C. Langer, R. Ozeri, N. Shiga, D.J. Wineland, Phys. Rev. Lett. 96, 253003 (2006).
R. Maiwald, D. Leibfried, J. Britton, J.C. Bergquist, G. Leuchs, D.J. Wineland, Nat. Phys. 5, 551 (2009); C.L. Arrington et al., Rev. Sci. Instrum. 84, 085001 (2013).
R. DeVoe, C. Kurtsiefer, Phys. Rev. A 65, 063407 (2002).
D.R. Leibrandt, J. Labaziewicz, R.J. Clark, I.L. Chuang, R.J. Epstein, C. Ospelkaus, J.H. Wesenberg, J.H. Bollinger, D. Leibfried, D. Wineland, D. Stick J. Sterk, C. Monroe, C.-S. Pai, Y. Low, R. Frahm, R.E. Slusher, Quantum Inf. Comput. 9, 901 (2009).
J. Britton, D. Leibfried, J.A. Beall, R.B. Blakestad, J.H. Wesenberg, D.J. Wineland, Appl. Phys. Lett. 95, 173102 (2009).
D. Stick, K.M. Fortier, R. Haltli, C. Highstrete, D.L. Moehring, C. Tigges, M.G. Blain, Physics (2010) (available at http://arxiv.org/abs/1008.0990v2).
J.T. Merrill, C. Volin, D. Landgren, J.M. Amini, K. Wright, S.C. Doret, C.-S. Pai, H. Hayden, T. Killian, D. Faircloth, K.R. Brown, A.W. Harter, R.E. Slusher, New J. Phys. 13, 103005 (2011).
M.D. Barrett, J. Chiaverini, T. Schaetz, J. Britton, W.M. Itano, J.D. Jost, E. Knill, C. Langer, D. Leibfried, R. Ozeri, D.J. Wineland, Nature 429, 737 (2004).
R.B. Blakestad, C. Ospelkaus, A.P. VanDevender, J.H. Wesenberg, M.J. Biercuk, D. Leibfried, D.J. Wineland, Phys. Rev. A 84, 032314 (2011).
M. Cetina A. Grier, J. Campbell, I. Chuang, V. Vuletic, Phys. Rev. A 76, 041401 (2007).
J.M. Sage, A.J. Kerman, J. Chiaverini, Phys. Rev. A 86, 013417 (2012).
L. Deslauriers, S. Olmschenk, D. Stick, W.K. Hensinger, J. Sterk, C. Monroe Phys. Rev. Lett. 97, 103007 (2006).
J. Labaziewicz Y.F. Ge, P. Antoli, D. Leibrandt, K.R. Brown, I.L. Chuang, Phys. Rev. Lett. 100, 013001 (2008).
J. Labaziewicz, Y.F. Ge, D. Leibrandt, S.X. Wang, R. Shewmon, I.L. Chuang, Phys. Rev. Lett. 101, 180602 (2008).
S.X. Wang, Y.F. Ge, J. Labaziewicz, E. Dauler, K. Berggren, I.L. Chuang, Appl. Phys. Lett. 97, 244102 (2010).
K.R. Brown, C. Ospelkaus, Y. Colombe, A.C. Wilson, D. Leibfried, D.J. Wineland, Nature 471, 196 (2011).
B. Hammer, J.K. Nørskov, Nature 376, 238 (1995).
G.V. Hansson, S.A. Flodström, Phys. Rev. B 18, 1572 (1978).
T.-S. Lin, Y.-W. Chung, Superlattices Microstruct. 4, 709 (1988).
M. Chaigneau, G. Picardi, R. Ossikovski, Surf. Sci. 604, 701 (2010).
K. Boller, R.P. Haelbich, H. Hogrefe, W. Jark, C. Kunz, Nucl. Instrum. Methods 208, 273 (1983).
J. Krim, Thin Solid Films 137, 297 (1986).
R.E. Clausing, L.C. Emerson, L. Heatherly, R.J. Colchin, J.C. Twichell, J. Vac. Sci. Technol. 13, 437 (1976).
D.A. Hite, Y. Colombe, A.C. Wilson, K.R. Brown, U. Warring, R. Jördens J.D. Jost, K.S. McKay, D.P. Pappas, D. Leibfried, D.J. Wineland, Phys. Rev. Lett. 109, 103001 (2012).
A. Krozer, M. Rodahl, J. Vac. Sci. Technol., A 15, 1704 (1997).
Ph. Delaporte, R. Oltra, in Recent Advances in Laser Processing of Materials (European Materials Research Society Series), J. Perriere, E. Millon, E. Fogarassy, Eds. (Elsevier, Amsterdam, 2006), pp. 411–440.
R. Viswanathan, I. Hussia, J. Opt. Soc. B 3, 796 (1986).
H.K. Park, C.P. Grigoropoulos, W.P. Leung, A.C. Tam, IEEE Trans. Compon. Packag. Manuf. Technol. Part A 17, 631 (1994).
D.T.C. Allcock, L. Guidoni, T.P. Harty, C.J. Ballance, M.G. Blain, A.M. Steane, D.M. Lucas, New J. Phys. 13, 123023 (2011).
W. Kautek, J. Krüger, Proc. SPIE 2207, 600 (1994).
After submission of this article, similar analyses and results have been reported by N. Daniilidis, S. Gerber, G. Bolloten, M. Ramm, A. Ransford, E. Ulin-Avila I. Talukdar, H. Häffner, Physics (2013) (available at arXiv 1307.7194v1).
T. Rosenband, D.B. Hume, P.O. Schmidt, C.W. Chou, A. Brusch, L. Lorini W.H. Oskay, R.E. Drullinger, T.M. Fortier, J.E. Stalnaker, S.A. Diddams, W.C. Swann, N.R. Newbury, W.M. Itano, D.J. Wineland, J.C. Bergquist, Science 319, 1808 (2008).
Y.T. Yang, C. Callegari, X.L. Feng, M.L. Roukes, Nano Lett. 11, 1753 (2011)
N.A. Robertson, J.R. Blackwood, S. Buchman, R.L. Byer, J. Camp, D. Gill, J. Hanson, S. Williams, P. Zhou, Class. Quantum Grav. 23, 2665 (2006).
R.D. Reasenberg, B.R. Patla, J.D. Phillips, R. Thapa, Class. Quantum Grav. 29, 184013 (2012).
A.O. Sushkov, W.J. Kim, D.A.R. Dalvit, S.K. Lamoreaux, Nat. Phys. 7, 230 (2011).
R.O. Behunin, Y. Zeng, D.A.R. Dalvit, S. Reynaud, Phys. Rev. A 86, 052509 (2012).
Ch. Roos, Th. Zeiger, H. Rohde, H.C. Nägerl, J. Eschner, D. Leibfried F. Schmidt-Kaler, R. Blatt, Phys. Rev Lett. 83, 4713 (1999).
Chr. Tamm, D. Engelke, V. Bühner, Phys. Rev A 61, 053405 (2000).
L. Deslauriers, P.C. Haljan, PJ. Lee, K.-A. Brickman, B.B. Blinov, M.J. Madsen, C. Monroe, Phys. Rev A 70, 043408 (2004).
D. Stick, W.K. Hensinger, S. Olmschenk, M.J. Madsen, K. Schwab, C. Monroe, Nat. Phys. 2, 36 (2006).
R.J. Epstein, S. Seidelin, D. Leibfried, J.H. Wesenberg, J.J. Bollinger, J.M. Amini, R.B. Blakestad, J. Britton, J.P. Home, W.M. Itano, J.D. Jost, E. Knill, C. Langer R. Ozeri, N. Shiga, D.J. Wineland, Phys. Rev A 76, 033411 (2007).
D.M. Lucas, B.C. Keitch, J.P. Home, G. Imreh, M.J. McDonnell, D.N. Stacey, D.J. Szwer, A.M. Steane, Quantum Phys. (2007) (available at arxiv/pdf/0710/0710.4421v1.pdf).
J. Benhelm, G. Kirchmair, C.F. Roos, R. Blatt, Phys. Rev A 77, 062306 (2008).
S.A. Schulz, U. Poschinger, F. Ziesel, F. Schmidt-Kaler, New J. Phys. 10, 045007 (2008).
D.T.C. Allcock, J.A. Sherman, M.J. Curtis, G. Imreh, A.H. Burrell, D.J. Szwer D.N. Stacey, A.M. Steane, D.M. Lucas, New J. Phys. 12, 053026 (2010).
U. Warring, C. Ospelkaus, Y. Colombe, K.R. Brown, J.M. Amini, M. Carsjens, D. Leibfried, D.J. Wineland, Phys. Rev. A 87, 013437 (2013).
Acknowledgements
This article is a contribution of NIST and is not subject to US copyright. This work was supported by IARPA under ARO Contract Numbers DNI-017389 and EAO-139840, ONR, and the NIST Quantum Information Program. We thank Jim Bergquist, Jim Phillips, and Mark Gesley for helpful discussions, and K.S. McKay and M.R. Vissers for suggestions on the manuscript.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Hite, D.A., Colombe, Y., Wilson, A.C. et al. Surface science for improved ion traps. MRS Bulletin 38, 826–833 (2013). https://doi.org/10.1557/mrs.2013.207
Published:
Issue Date:
DOI: https://doi.org/10.1557/mrs.2013.207


