Abstract
Micromechanical testing of electroplated gold alloy films has been conducted using theta-like specimens. Specimens were formed by a standard combination of photolithography, electroplating, and deep reactive ion etching. Testing was performed using an instrumented indenter and the results interpreted using a finite-element model with a Ramberg-Osgood constitutive law to extract elastic and plastic material properties. The observed results were highly repeatable and appear to be sensitive to variations in both sample dimensions and material properties. These qualities suggest that the testing methodology may have significant value as a quality control technique in the fabrication of metal micro-electromechanical systems.
Similar content being viewed by others
References
C. Keimel, G. Claydon, B. Li, J. Park, and M.E. Valdes: Micro-Electromechanical-System (MEMS) based switches for power applications. Conf. Records - Industrial & Commercial Power Systems Technical Conf., Institute of Electrical and Electronics Engineers Inc.: Newport Beach, CA, 2011. p. 1.
B. Pillans, J. Kleber, C. Goldsmith, and M. Eberly: RF power handling of capacitive RF MEMS devices (IEEE MTT - Int. Microwave Symp. Digest, Seattle, WA, 2002) p. 329.
M.D. Uchic, P.A. Shade, and D.M. Dimiduk: Plasticity of micrometer-scale single crystals in compression. Annu. Rev. Mater. Res. 39, 361 (2009).
J.R. Greer, and W.D. Nix: Size dependence of mechanical properties of gold at the sub-micron scale. Appl. Phys. A 80, 1625 (2005).
D. Kiener, W. Grosinger, G. Dehm, and R. Pippan: A further step towards an understanding of size-dependent crystal plasticity: in situ tension experiments of miniaturized single-crystal copper samples. Acta Mater. 56, 580 (2008).
Y. Takahashi, H. Kondo, H. Niimi, and T. Nokuo: Fracture strength analysis of single-crystalline silicon cantilevers processed by focused ion beam. Sens. Actuators A 206, 81–87 (2014).
M.S. Gaither, F.W. DelRio, R.S. Gates, E.R. Fuller Jr., and R.F. Cook: Strength distribution of single-crystal silicon theta-like specimens. Scr. Mater. 63, 422 (2010).
J.D. Lord, B. Roebuck, R. Morrell, and T. Lube: Aspects of strain and strength measurement in miniaturized testing for engineering metals and ceramics. Mater. Sci. Technol. 26, 127 (2010).
M.S. Gaither, R.S. Gates, R. Kirkpatrick, R.F. Cook, and F.W. DelRio: Etching process effects on surface structure, fracture strength, and reliability of single-crystal silicon theta-like specimens. J. Microelectromech. Syst. 22, 589–602 (2013).
M.S. Gaither, F.W. DelRio, R.S. Gates, and R.F. Cook: Deformation and fracture of single-crystal silicon theta-like specimens. J. Mater. Res. 26, 2575 (2011).
W. Ramberg, and W.R. Osgood: Description of stress-strain curves by three parameters. Natl. Advis. Comm. Aeronaut. Tech. Note 902 (1943).
R.W. Hertzberg: Deformation and Fracture Mechanics of Engineering Materials, 4th ed. (John Wiley & Sons, Inc., Hoboken, NJ, 1995).
H.D. Espinosa, and B.C. Prorok: Size effects on the mechanical behavior of gold thin films. J. Mater. Sci. 38, 4125 (2003).
R.S. Gates, and J.R. Pratt: Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometry. Nanotechnology 23, 375702 (2012).
R.S. Gates, and M.G. Reitsma: Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array. Rev. Sci. Instrum. 78, 086101 (2007).
I. Chasiotis, C. Bateson, K. Timpano, A.S. McMarty, N.S. Barker, and J.R. Stanec: Strain rate effects on the mechanical behavior of nanocrystalline Au films. Thin Solid Films 515, 3183 (2007).
Z. Yang, D.J. Lichtenwalner, A.S. Morris, J. Krim, and A.I. Kingon: Comparison of Au and Au-Ni alloys as contact materials for MEMS switches. J. Microelectromech. Syst. 18, 287 (2009).
Acknowledgments
The authors would like to acknowledge Drs Robert F. Cook, Richard S. Gates, and Brian G. Bush from the National Institute of Standards and Technology for their contributions to this work. Some research was performed at the NIST Center for Nanoscale Science and Technology (CNST).
Author information
Authors and Affiliations
Corresponding author
Supplementary materials
Supplementary materials
For supplementary material for this article, please visit http://dx.doi.org/10.1557/mrc.2015.48
Rights and permissions
About this article
Cite this article
McLean, M.J., Osborn, W.A., Kirkpatrick, R. et al. Micromechanical testing of electroplated gold alloy films using theta-like specimens. MRS Communications 5, 503–506 (2015). https://doi.org/10.1557/mrc.2015.48
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/mrc.2015.48