Abstract
Here we report on the photocurrent response of two-dimensional (2D) heterostructures of sputtered MoS2 on boron nitride (BN) deposited on (001)-oriented Si substrates. The steady state photocurrent (Iph) measurements used a continuous laser of λ = 658 nm (E = 1.88 eV) over a broad range of laser intensities, P (∼1 µW < P < 10 µW), and indicate that Iph obtained from MoS2 layers with the 80 nm BN under layer was ∼4 times higher than that obtained from MoS2 layers with the 30 nm BN under layer. We also found super linear dependence of Iph on P (Iph ∝ Pγ, with γ > 1) in both the samples. The responsivities obtained over the range of laser intensity studied were in the order of mA/W (∼12 and ∼2.7 mA/W with 80 nm BN and 30 nm BN under layers, respectively). These investigations provide crucial insight into the optical activity of MoS2 on BN, which could be useful for developing a variety of optoelectronic applications with MoS2 or other 2D transition metal dichalcogenide heterostructures.
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References
K.S. Novoselov, D. Jiang, F. Schedin, T.J. Booth, V.V. Khotkevich, S.V. Morozov, and A.K. Geim: Two-dimensional atomic crystals. Proc. Natl. Acad. Sci. U. S. A. 102, 10451 (2005).
D. Jariwala, V.K. Sangwan, L.J. Lauhon, T.J. Marks, and M.C. Hersam: Emerging device applications for semiconducting two-dimensional transition metal dichalcogenides. ACS Nano 8, 1102 (2014).
N. Pradhan, D.A. Rhodes, S. Memaran, J.M. Poumirol, D. Smirnov, S. Talapatra, S. Feng, N. Perea-López, A.L. Elias, M. Terrones, P.M. Ajayan, and L. Balicas: Hall and field-effect mobilities in few layered p-WSe2 field-effect transistors. Sci. Rep. 5, 8979 (2015).
B. Radisavljevic, A. Radenovic, J. Brivio, V. Giacometti, and A. Kis: Single-layer MoS2 transistors. Nat. Nanotechnol. 6, 147 (2011).
S. Ghosh, S. Najmaei, S. Kar, R. Vajtai, N. Pradhan, J. Lou, L. Balicas, P.M. Ajayan, and S. Talapatra: Universal ac conductance in large area CVD grown MoS2. Phys. Rev. B 89, 125422 (2014).
Q.H. Wang, K. Kalantar-Zadeh, A. Kis, J.N. Coleman, and M.S. Strano: Electronics and optoelectronics of two-dimensional transition metal dichalcogenides. Nat. Nanotechnol. 7, 699 (2012).
S. Kim, A. Konar, W. Hwang, J.H. Lee, J. Lee, J. Yang, C. Jung, H. Kim, J.B. Yoo, J.Y. Choi, Y.W. Jin, S.Y. Lee, D. Jena, W. Choi, and K. Kim: High-mobility and low-power thin-film transistors based on multilayer MoS2 crystals. Nat. Commun. 3, 1011 (2012).
Y. Zhang, J. Ye, Y. Matsuhashi, and Y. Iwasa: Ambipolar MoS2 thin flake transistors. Nano Lett. 12, 1136 (2012).
Z. Yin, H. Li, H. Li, L. Jiang, Y. Shi, Y. Sun, G. Lu, Q. Zhang, X. Chen, and H. Zhang: Single-layer MoS2 phototransistors. ACS Nano 6(1), 74 (2012).
H.S. Lee, S.W. Min, Y.G. Chang, M.K. Park, T. Nam, H. Kim, J.H. Kim, S. Ryu, and S. Im: MoS2 nanosheet phototransistors with thickness-modulated optical energy gap. Nano Lett. 12(7), 3695 (2012).
S. Ghosh, A. Winchester, B. Muchharla, M. Wasala, S. Feng, A.L. Elias, M.B.M. Krishna, T. Harada, C. Chin, K. Dani, S. Kar, M. Terrones, and S. Talapatra: Ultrafast intrinsic photoresponse and direct evidence of sub-gap states in liquid phase exfoliated MoS2 thin films. Sci. Rep. 5, 11272 (2015).
W. Bao, X. Cai, D. Kim, K. Sridhara, and M.S. Fuhrer: High mobility ambipolar MoS2 field-effect transistors: Substrate and dielectric effects. Appl. Phys. Lett. 102, 042104 (2013).
I. Bilgin, F. Liu, A. Vargas, A. Winchester, M.K.L. Man, M. Upmanyu, K. Dani, G. Gupta, S. Talapatra, A.D. Mohite, and S. Kar: Chemical vapor deposition synthesized atomically-thin molybdenum disulfide with optoelectronic-grade crystalline quality. ACS Nano 9(9), 8822 (2015).
M. Buscema, G.A. Steele, H.S.J. van der Zant, and A. Castellanos-Gomez: The effect of the substrate on the Raman and photoluminescence emission of single-layer MoS2. Nano Res. 7, 561 (2014).
D-H. Lien, J.S. Kang, M. Amani, K. Chen, M. Tosun, H-P. Wang, T. Roy, M.S. Eggleston, M.C. Wu, M. Dubey, S-C. Lee, J-H. He, and A. Javey: Engineering light outcoupling in 2D materials. Nano Lett. 15, 1356 (2015).
Y. Gong, J. Lin, X. Wang, G. Shi, S. Lei, Z. Lin, X. Zou, G. Ye, R. Vajtai, B.I. Yakobson, H. Terrones, M. Terrones, B.K. Tay, J. Lou, S.T. Pantelides, Z. Liu, W. Zhou, and P.M. Ajayan: Vertical and in-plane heterostructures from WS2/MoS2 monolayers. Nat. Mater. 13, 1135 (2014).
Z. Liu, L. Song, S. Zhao, J. Huang, L. Ma, J. Zhang, J. Lou, and P.M. Ajayan: Direct growth of graphene/hexagonal boron nitride stacked layers. Nano Lett. 11(5), 2032 (2011).
Y. Shi, W. Zhou, A.Y. Lu, W. Fang, Y.H. Lee, A.L. Hsu, S.M. Kim, K.K. Kim, H.Y. Yang, L.J. Li, J.C. Idrobo, and J. Kong: van der Waals epitaxy of MoS2 layers using graphene as growth templates. Nano Lett. 12(6), 2784 (2012).
M. Okada, T. Sawazaki, K. Watanabe, T. Taniguch, H. Hibino, H. Shinohara, and R. Kitaura: Direct chemical vapor deposition growth of WS2 atomic layers on hexagonal boron nitride. ACS Nano 8(8), 8273 (2014).
X. Zhang, F. Meng, J.R. Christianson, C. Arroyo-Torres, M.A. Lukowski, D. Liang, J.R. Schmidt, and S. Jin: Vertical heterostructures of layered metal chalcogenides by van der Waals epitaxy. Nano Lett. 14(6), 3047 (2014).
M. Björck and G. Andersson: GenX: An extensible x-ray reflectivity refinement program utilizing differential evolution. J. Appl. Cryst. 40, 1174 (2007).
B.C. Windom, W.G. Sawyer, and D.W. Hahn: A Raman spectroscopic study of MoS2 and MoO3: Applications to tribological systems. Tribol. Lett. 42(3), 301 (2011).
H. Li, Q. Zhang, C.C.R. Yap, B.K. Tay, T.H.T. Edwin, A. Olivier, and D. Baillargeat: From bulk to monolayer MoS2: Evolution of Raman scattering. Adv. Funct. Mater. 22, 1385 (2012).
C. Lee, H. Yan, L.E. Brus, T.F. Heinz, J. Hone, and S. Ryu: Anomalous lattice vibrations of single- and few-layer MoS2. ACS Nano 4(5), 2695 (2010).
M. Boukhicha, M. Calandra, M.A. Measson, O. Lancry, and A. Shukla: Anharmonic phonons in few-layer MoS2: Raman spectroscopy of ultralow energy compression and shear modes. Phys. Rev. B 87, 195316 (2013).
A. Rose: Recombination processes in insulators and semiconductors. Phys. Rev. 97(2), 322 (1955).
N. Perea-López, A.L. Elías, A. Berkdemir, A. Castro-Beltran, H.R. Gutiérrez, S. Feng, R. Lv, T. Hayashi, F. López-Urías, S. Ghosh, B. Muchharla, S. Talapatra, H. Terrones, and M. Terrones: Photosensor device based on few-layered WS2 films. Adv. Funct. Mater. 23, 5511 (2013).
S. Kundu, S. Ghosh, M. Fralaide, T.N. Narayanan, V.K. Pillai, and S. Talapatra: Fractional photo-current dependence of graphene quantum dots prepared from carbon nanotubes. Phys. Chem. Chem. Phys. 17, 24566 (2015).
K.K. Chi: Dielectric Phenomena in Solids (Academic Press, Burlington, 2004).
N.F. Mott and E. Davis: Electronic Processes in Non-crystalline Materials (Oxford University Press, London, 1971).
N. Kushwaha, V.S. Kushwaha, R.K. Shukla, and A. Kumar: Determination of energy of defect centers in a-Se78Ge22 thin films. Philos. Mag. Lett. 86, 691 (2006).
N.A. Bakr: Anomalous photoconductive transport properties of As2Se3 films. Egypt. J. Sol. 25, 13 (2002).
V. Klee, E. Preciado, D. Barroso, A.E. Nguyen, C. Lee, K.J. Erickson, M. Triplett, B. Davis, I-H. Lu, S. Bobek, J. McKinley, J.P. Martinez, J. Mann, A.A. Talin, L. Bartels, and F. Léonard: Superlinear composition-dependent photocurrent in CVD-grown monolayer MoS2(1–x)Se2 x alloy devices. Nano Lett. 15, 2612 (2015).
H. Qiu, L. Pan, Z. Yao, J. Li, Y. Shi, and X. Wang: Electrical characterization of back-gated bi-layer MoS2 field-effect transistors and the effect of ambient on their performances. Appl. Phys. Lett. 100, 123104 (2012).
W. Park, J. Park, J. Jang, H. Lee, H. Jeong, K. Cho, S. Hong, and T. Lee: Oxygen environmental and passivation effects on molybdenum disulfide field effect transistors. Nanotechnology 24, 095202 (2013).
ACKNOWLEDGMENTS
This work is supported by the U.S. Army Research Office through a MURI Grant No. W911NF-11-1-0362. The X-ray reflectivity experiment shown was carried out in the Frederick Seitz Materials Research Laboratory Central Research Facilities, University of Illinois. D.M. would like to acknowledge Dr. Mauro Sardela for his help with X-ray measurements.
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This author was an editor of this journal during the review and decision stage. For the JMR policy on review and publication of manuscripts authored by editors, please refer to http://www.mrs.org/jmr-editor-manuscripts/.
A previous error in this article has been corrected, see https://doi.org/10.1557/jmr.2016.129.
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Wasala, M., Zhang, J., Ghosh, S. et al. Effect of underlying boron nitride thickness on photocurrent response in molybdenum disulfide — boron nitride heterostructures. Journal of Materials Research 31, 893–899 (2016). https://doi.org/10.1557/jmr.2015.364
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DOI: https://doi.org/10.1557/jmr.2015.364