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Evidence for self-organization processes in PbTe-Bi2Te3 semiconductor solid solutions

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Abstract

The dependences of unit cell parameter, x-ray diffraction line width B, and microhardness H on the composition of PbTe-Bi2Te3 (0–10 mol% Bi2Te3) semiconductor alloys, subjected to different types of heat treatment, were obtained. In the concentration ranges ∼0.5–1.5 and 3–4 mol% Bi2Te3 within the homogeneity region of PbTe (0–6 mol% Bi2Te3), anomalous constancy or decrease in B and H was observed. A long room temperature aging leads to a more distinct manifestation of these effects. It is suggested that the observed peculiarities in the concentration dependences of the properties are connected with percolation effects and self-organization processes in the solid solution.

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Acknowledgments

This work was supported by the Ukrainian Fundamental Research Foundation (Grant F25.2/189-2008).

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Authors and Affiliations

  1. Theoretical & Experimental Physics Department, National Technical University “Kharkov Polytechnic Institute,”, 61002, Kharkov, Ukraine

    Elena Rogacheva, Olga Vodorez, Vladimir Pinegin & Olga Nashchekina

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  1. Elena Rogacheva
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  2. Olga Vodorez
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  3. Vladimir Pinegin
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  4. Olga Nashchekina
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Correspondence to Elena Rogacheva.

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Rogacheva, E., Vodorez, O., Pinegin, V. et al. Evidence for self-organization processes in PbTe-Bi2Te3 semiconductor solid solutions. Journal of Materials Research 26, 1627–1633 (2011). https://doi.org/10.1557/jmr.2011.165

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  • DOI: https://doi.org/10.1557/jmr.2011.165

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