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Development of a Seebeck coefficient Standard Reference Material™

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Abstract

We have successfully developed a Seebeck coefficient Standard Reference Material (SRM™), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential steady-state technique on 10 samples (15 measurements) randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10 to 390 K, and they are further supported by transient measurements. The availability of this SRM will validate measurement results, leading to a better understanding of the structure/property relationships and underlying physics of potential high-efficiency thermoelectric materials.

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ACKNOWLEDGMENTS

The authors acknowledge the partial financial support from the former Materials Science and Engineering Laboratory (currently Material Measurement Laboratory) of NIST. The assistance of S. Claggett for sample preparation of the interface layers of one of the SRM artifacts is also acknowledged.

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Authors and Affiliations

  1. National Institute of Standards and Technology, Gaithersburg, Maryland, 20899, USA

    Nathan D. Lowhorn, Winnie Wong-Ng, Zhan-Qian Lu, Joshua Martin, Martin L. Green, John E. Bonevich & Evan L. Thomas

  2. Quantum Design, Inc., San Diego, California, 92126, USA

    Neil R. Dilley

  3. Marlow Industries, Inc., Dallas, Texas, 75238, USA

    Jeff Sharp

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  1. Nathan D. Lowhorn
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  2. Winnie Wong-Ng
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  3. Zhan-Qian Lu
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  4. Joshua Martin
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  5. Martin L. Green
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  6. John E. Bonevich
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  7. Evan L. Thomas
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  8. Neil R. Dilley
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  9. Jeff Sharp
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Correspondence to Winnie Wong-Ng.

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Lowhorn, N.D., Wong-Ng, W., Lu, ZQ. et al. Development of a Seebeck coefficient Standard Reference Material™. Journal of Materials Research 26, 1983–1992 (2011). https://doi.org/10.1557/jmr.2011.118

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  • DOI: https://doi.org/10.1557/jmr.2011.118

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