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Effects of residual (or internal) stress on ferroelectric domain wall motion in tetragonal lead titanate

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Abstract

The effect of temperature on grinding-induced texture in tetragonal lead titanate (PT) has been investigated as a function of the magnitude of loading applied to the sample surface during grinding, using in situ x-ray diffraction (XRD) with an area detector. Compared to the ground PT under lower loading conditions (5 N), the ground PT under higher loading conditions (40 N) retains strong ferroelastic texture near the Curie temperature (TC) around 350 °C and undergoes smaller changes in lattice parameter or tetragonality versus temperature during in situ thermal cycling between room temperature and approximately 100 °C above the TC. Inhibited depoling of ground PT materials investigated by in situ texture measurements demonstrates the effects of residual stresses.

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Authors and Affiliations

  1. Battery Research Center, Korea Institute of Science and Technology, Seongbuk-gu, Seoul, 136-791, Korea

    Wonyoung Chang

  2. Ames Laboratory, Ames, Iowa, 50011, USA

    Alexander H. King

  3. Purdue University, West Lafayette, Indiana, 47907, USA

    Keith J. Bowman

Authors
  1. Wonyoung Chang
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  2. Alexander H. King
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  3. Keith J. Bowman
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Correspondence to Keith J. Bowman.

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Chang, W., King, A.H. & Bowman, K.J. Effects of residual (or internal) stress on ferroelectric domain wall motion in tetragonal lead titanate. Journal of Materials Research 24, 1803–1809 (2009). https://doi.org/10.1557/jmr.2009.0218

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  • DOI: https://doi.org/10.1557/jmr.2009.0218

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