Skip to main content
Log in

Local dielectric measurements of BaTiO3–CoFe2O4 nanocomposites through microwave microscopy

  • Published:
Journal of Materials Research Aims and scope Submit manuscript

Abstract

We report on linear and nonlinear dielectric property measurements of BaTiO3–CoFe2O4 (BTO–CFO) ferroelectromagnetic nanocomposites and pure BaTiO3 and CoFe2O4 samples with scanning near-field microwave microscopy. The permitivity scanning image with spatial resolution on the micrometer scale shows that the nanocomposites have a very uniform quality with an effective dielectric constant ɛr = 140 ± 6.4 at 3.8 GHz and room temperature. The temperature dependence of dielectric permittivity shows that the Curie temperature of pure BTO was shifted by the clamping effect of the MgO substrate, whereas the Curie temperature shift of the BTO ferroelectric phase in BTO–CFO composites is less pronounced, and if it exists at all, would be mainly caused by the CFO. Nonlinear dielectric measurements of BTO–CFO show good ferroelectric properties from the BTO.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. V.E. Wood and A.E. Austin: Possible applications for magnetoelectric materials. Int. J. Magn. 5, 303 (1974).

    CAS  Google Scholar 

  2. G.A. Smolenskii and I.E. Chupis: Ferroelectromagnets. Sov. Phys. Usp. 25, 475 (1982).

    Article  Google Scholar 

  3. B.I. Al’shin and D. Astrov: Magnetoelectric effect in titanium oxide Ti2O3. Sov. Phys. JETP 17, 809 (1963).

    Google Scholar 

  4. J.G. Wan, J.M. Liu, H.L.W Chand, C.L. Choy, G.H. Wang, and C.W. Nan: Giant magnetoelectric effect of a hybrid of magnetostrictive and piezoelectric composites. J. Appl. Phys. 93, 9916 (2003).

    Article  CAS  Google Scholar 

  5. K.S. Chang, M.A. Aronova, C.L. Lin, M. Murakami, M.H. Yu, J. Hattrick-Simpers, O.O. Famodu, S.Y. Lee, R. Ramesh, M. Wuttig, I. Takeuchi, C. Gao, and L.A. Bendersky: Exploration of artificial multiferroic thin film heterostructures using composition spreads. Appl. Phys. Lett. 84, 3091 (2004).

    Article  CAS  Google Scholar 

  6. H. Zheng, J. Wang, S.E. Lofland, Z. Ma, L. Mohaddes-Ardabili, T. Zhao, L. Salamanca-Riba, S.R. Shinde, S.B. Ogale, F. Bai, D. Viehland, Y. Jia, D.G. Schlom, M. Wuttig, A. Roytburd, and R. Ramesh: Multiferroic BaTiO3-CoFe2O4 nanostructures. Science 303, 661 (2004).

    Article  CAS  Google Scholar 

  7. D.E. Steinhauer, C.P. Vlahacos, F.C. Wellswood, and S.M. Anlage: Quantitative imaging of dielectric permittivity and tunability with a near field scanning microwave microscope. Rev. Sci. Instrum. 71, 2751 (2000).

    Article  CAS  Google Scholar 

  8. H.M. Altshuler: Dielectric constant, in Handbook of Microwave Measurements II edited by M. Sucher and J. Fox (Polytechnic Institute of Brooklyn, Brooklyn, NY, 1963) p. 532.

    Google Scholar 

  9. A. Imtiaz, M. Pollak, S.M. Anlage, J.D. Barry, and J. Melngailis: Near-field microwave microscopy on nanometer length scales. J. Appl. Phys. 97, 044302 (2005).

    Article  Google Scholar 

  10. A. Imtiaz and M. Steven: Anlage, Effect of tip-geometry on contrast and spatial-resolution of the near-field microwave microscope. J. Appl. Phys. 100, 044304 (2006).

    Article  Google Scholar 

  11. D.E. Steinhauer, C.P. Vlahacos, F.C. Wellstood, S.M. Anlage, C. Canedy, R. Ramesh, A. Stanishevsky, and J. Melngailis: Imaging of microwave permittivity, tunability, and damage recovery in (Ba,Sr)TiO3 thin films. Appl. Phys. Lett. 75, 3180 (1999).

    Article  CAS  Google Scholar 

  12. S.M. Anlage, V.V. Talanov, and A.R. Schwartz: Principles of near-field microwave microscopy, section 4.7, in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale edited by S. Kalinin and A. Gruverman (Springer, New York, 2006), p. 207.

    Google Scholar 

  13. C.W. Nan: Magneto-electric effect in composites of piezoelectric and piezomagnetic phases. Phys. Rev. B 50, 6082 (1994).

    Article  CAS  Google Scholar 

  14. B.H. Hoerman, G.M. Ford, L.D. Kaufmann, and B.W. Wessels: Dielectric properties of epitaxial BaTiO3 thin films. Appl. Phys. Lett. 73, 16 (1998).

    Article  Google Scholar 

  15. K. Sakayori, Y. Matsui, and H. Abe: Curie temperature of BaTiO3. Japan. J Appl. Phys. Part 1 34, 5443 (1995).

    Article  CAS  Google Scholar 

  16. L.J. Sinnamon, R.M. Bowman, and J.M. Gregg: Thickness-induced stabilization of ferroelectricity in SrRuO3/Ba0.5Sr0.5TiO3/Au thin film capacitors. Appl. Phys. Lett. 81, 889 (2002).

    Article  CAS  Google Scholar 

  17. C.B. Parker, J.P. Maria, and A.I. Kingon: Temperature and thickness dependent permittivity of (Ba,Sr)TiO3 thin films. Appl. Phys. Lett. 81, 340 (2002).

    Article  CAS  Google Scholar 

  18. S.L. Miller, R.D. Nasby, J.R. Schwank, M.S. Rodgers, and P.V. Dressendorfer: Device modeling of ferroelectric capacitors. J. Appl. Phys. 68, 6463 (1990).

    Article  Google Scholar 

  19. J. Miao, H. Yang, W. Hao, J. Yuan, B. Xu, X.Q. Qiu, L.X. Cao, and B.R. Zhao: Temperature dependence of the ferroelectric and dielectric properties of the BST/LSMO heterostructure. J. Phys. D: Appl. Phys. 38, 5 (2005).

    Article  CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Steven M. Anlage.

Additional information

This author was an editor of this journal during the review and decision stage. For the JMR policy on review and publication of manuscripts authored by editors, please refer to http://www.mrs.org/jmr_policy.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Qi, Y., Anlage, S.M., Zheng, H. et al. Local dielectric measurements of BaTiO3–CoFe2O4 nanocomposites through microwave microscopy. Journal of Materials Research 22, 1193–1199 (2007). https://doi.org/10.1557/jmr.2007.0174

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/jmr.2007.0174

Navigation