Abstract
Interfacial reactions of Sn-Cu alloys with Ni substrate at 250 °C have been investigated by varying the Cu contents from 0.3wt%Cu to 3.0wt%Cu. The Cu6Sn5 phase is not found in the Sn-0.3wt%Cu/Ni couple. The interfacial reaction sequence of the Sn-0.6wt%Cu/Ni couple is similar to that of the Sn-0.7wt%Cu/Ni. The reaction follows Cu6Sn5 formation stage, growth stage, detachment stage, Cu6Sn5 layer continuing growth stage, Ni3Sn4 formation stage, Cu6Sn5 phase dissolution stage, Ni3Sn4 detachment stage, and Ni3Sn4 phase dissolution stage. Similar results are found for the couples prepared with higher Cu contents, 0.8wt%Cu, 1.0wt%Cu, 2.0wt%Cu, and 3.0wt%Cu, but the detachment positions are different. For the couples with higher Cu-content, the layer detaches at the Cu6Sn5/Ni interface; however, for the 0.6wt%Cu and 0.7wt%Cu couples, the Cu6Sn5 phase layer fractures and detachment occurs inside the layer. Morphologies of the Cu6Sn5 phase are also found to change with Cu contents: the pyramidal shape in the 0.3wt%Cu couple changes to the rod-shape in the 0.8wt%Cu couple, and becomes a very fine rod shape in the 2.0wt%Cu couple.
Similar content being viewed by others
References
S. Choi, T.R. Bieler, J.P. Lucas, and K.N. Subramanian: Characterization of the growth of intermetallic interfacial layers of Sn-Ag and Sn-Pb eutectic solders and their composite solders on Cu substrate during isothermal long-term aging. J. Electron. Mater. 28, 1209 (1999).
K.N. Tu, A.M. Gusak, and M. Li: Physics and materials challenges for lead-free solders. J. Appl. Phys. 93, 1335 (2003).
D.R. Frear, J.W. Jang, J.K. Lin, and C. Zhang: Pb-free solders for flip chip interconnects. JOM 53, 28 (2001).
M. Abtew and G. Selvaduray: Lead-free solders in microelectronics. Mater. Sci. Eng. R27, 95 (2000).
J. Glazer: Metallurgy of low temperature Pb-free solders for electronic assembly. Int. Mater. Rev. 40, 63 (1995).
F. Zhang, M. Li, C.C. Chum, and K.N. Tu: Influence of substrate metallization on diffusion and reaction at the under-bump metallization/solder interface in flip-chip packages. J. Mater. Res. 17, 2757 (2002).
W.T. Chen, C.E. Ho, and C.R. Kao: Effect of Cu concentration on the interfacial reactions between Ni and Sn-Cu solders. J. Mater. Res. 17, 263 (2002).
C.H. Lin, S.W. Chen, and C.H. Wang: Phase equilibria and solidification properties of Sn-Cu-Ni alloys. J. Electron. Mater. 31, 907 (2002).
W.T. Chen: Effects of Cu concentration on the interfacial reactions between Ni and Sn-Cu solders. Master Thesis, National Central University, Chungli, Taiwan, (2002).
C.E. Ho, R.Y. Tsai, Y.L. Lin, and C.R. Kao: Effect of Cu concentration on the reactions between Sn-Ag-Cu solders and Ni. J. Electron. Mater. 31, 584 (2002).
K.S. Kim, S.H. Huh, and K. Suganuma: Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints. J. Alloys Compd. 352, 226 (2003).
J.W. Yoon, S.W. Kim, and S.B. Jung: IMC morphology, interfacial reaction and joint reliability of Pb-free Sn-Ag-Cu solder on electrolytic Ni BGA substrate. J. Alloys Compd. 392, 247 (2005).
H.F. Hsu and S.W. Chen: Phase equilibria of the Sn-Ag-Ni ternary system and interfacial reactions at the Sn-Ag-Ni joints. Acta Mater. 52, 2541 (2004).
D.Q. Yu, C.M.L Wu, D.P. He, N. Zhao, L. Wang, and J.K.L Lai: Effects of Cu contents in Sn-Cu solder on the composition and morphology of intermetallic compounds at a solder/Ni interface. J. Mater. Res. 20, 2205 (2005).
C.H. Wang and S.W. Chen: Sn-0.7wt%Cu/Ni interfacial reactions at 250 °C. Acta Mater. 54, 247 (2006).
H.Y. Lu, H. Balkan, and K.Y.S Ng: Solid-liquid reactions: The effect of Cu content on Sn-Ag-Cu interconnects. JOM 57, 30 (2002).
S.W. Chen and C.A. Chang: Phase equilibra of the Sn-Ag-Cu-Ni quaternary system at the Sn-rich corner. J. Electron. Mater. 33, 1071 (2004).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Chen, Sw., Wang, Ch. Interfacial reactions of Sn-Cu/Ni couples at 250 °C. Journal of Materials Research 21, 2270–2277 (2006). https://doi.org/10.1557/jmr.2006.0298
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/jmr.2006.0298