Abstract
CdZnTe:In single crystals were annealed in CdZn vapors through a method involving a high-temperature step and a low-temperature step in sequence. The effects of annealing on the properties of CdZnTe:In were characterized with photoluminescence (PL) spectra. The neutral acceptor bound exciton (A0, X) peak, which was on the right shoulder of the neutral donor bound exciton (D0, X) peak, disappeared after annealing. A fine donor-acceptor pair structure and its longitudinal optical phonon replicas were clear before annealing. However, both of them became undistinguishable in the PL spectrum of annealed CdZnTe:In. The two phenomena imply that the annealing treatment can remove the impurities from CdZnTe:In wafers effectively. In addition, the intensity of Dcomplex band fell remarkably after annealing, which confirmed that Cd vacancies were well-compensated in the annealing treatment.
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Yang, G., Jie, W. & Zhang, Q. Photoluminescence investigation of CdZnTe:In single crystals annealed in CdZn vapors. Journal of Materials Research 21, 1807–1809 (2006). https://doi.org/10.1557/jmr.2006.0219
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DOI: https://doi.org/10.1557/jmr.2006.0219