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Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films

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Abstract

A unique combination of in situ synchrotron x-ray diffraction and in situ micro-Raman spectroscopy was used to study the growth process of YBa2Cu3O6+x films obtained by metal organic decomposition using trifluoroacetate precursor on LaAlO3 substrates. The techniques give complementary information: x-ray diffraction gives insight into the structural growth, whereas micro-Raman spectroscopy gives information of the chemical composition with additional information on the texture. To perform both experiments in situ, a special high-temperature process chamber was designed.

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Authors and Affiliations

  1. ESRF, 38043, Grenoble Cedex 9, France

    F. Berberich & H. Graafsma

  2. CNRS - CRMHT, 45071, Orléans, France

    Rousseau B., A. Canizares, R. Ramy Ratiarison, N. Raimboux & P. Simon

  3. CNRS-Laboratoire de Cristallographie, 38402, Grenoble, France

    P. Odier

  4. ICMAB-CSIC, Campus de la Universitat Autònoma de Barcelona, 08193, Bellaterra, Spain

    N. Mestres, T. Puig & X. Obradors

Authors
  1. F. Berberich
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  2. H. Graafsma
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  3. Rousseau B.
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  4. A. Canizares
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  5. R. Ramy Ratiarison
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  6. N. Raimboux
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  7. P. Simon
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  8. P. Odier
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  9. N. Mestres
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  10. T. Puig
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  11. X. Obradors
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Correspondence to Rousseau B..

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Berberich, F., Graafsma, H., Rousseau, B. et al. Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films. Journal of Materials Research 20, 3270–3272 (2005). https://doi.org/10.1557/jmr.2005.0421

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  • DOI: https://doi.org/10.1557/jmr.2005.0421

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