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Materials Analysis with High Energy Ion Beams Part II: Channeling and Other Techniques

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Abstract

This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.

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Authors
  1. H. -J. Gossmann
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  2. L. C. Feldman
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Gossmann, H.J., Feldman, L.C. Materials Analysis with High Energy Ion Beams Part II: Channeling and Other Techniques. MRS Bulletin 12, 30–34 (1987). https://doi.org/10.1557/S0883769400067191

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  • DOI: https://doi.org/10.1557/S0883769400067191

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