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C. Robert Helms, guest editor for this issue of the MRS BULLETIN, is a professor of research in the Electrical Engineering Department at Stanford University. He received his BS from the University of California-Berkeley in 1968 and his PhD degree in electrical engineering from Stanford University in 1973. From 1973 through 1974, he was an IBM postdoctoral fellow at Stanford. In 1974 he joined EXXON Research and Engineering Company to pursue his interests in surface chemistry and catalytic properties of alloys. He returned to Stanford University in 1976 and received his present appointment in 1979. His current interests include semiconductor interface structures, interface analysis, and semiconductor materials processing. The major emphasis of this work is the relationship between electronic structure, chemical structure, and electrical properties of interfaces.
Helms has co-authored over 80 papers and has given 25 invited presentations at national meetings. He has been involved in various capacities such as program chairman or committee member at over 15 national meetings. He is a member of Phi Beta Kappa, Tau Beta Pi, the American Physical Society, American Vacuum Society, Electrochemical Society, and the Materials Research Society.
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Helms, C.R. Techniques for Materials Microanalysis. MRS Bulletin 12, 22–25 (1987). https://doi.org/10.1557/S0883769400067178
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DOI: https://doi.org/10.1557/S0883769400067178