Skip to main content
Log in

Multilayer Optics for the Soft X-Ray and Extreme Ultraviolet

  • Multilayer Materials
  • Published:
MRS Bulletin Aims and scope Submit manuscript

Conclusion

Multilayer x-ray optics and instrumentation are now mature enough to be both an enabling science/technology as well as areas of scientific investigation in their own right. The results presented here demonstrate the vitality and interdisciplinary character of this work. The promise that was held for SXR and EUV multilayer optics is now coming to fruition and many of the advanced optic Systems envisioned in the late 1970s are becoming reality. It should be clear that the current state of this field is based on the science and technology of multilayer microstructures that enables materials engineering at the atomic level. Both traditional and new experimental approaches based on these optics will be developed in the next decade. The novelty of multilayer VUV and soft x-ray optics will pass, but not their usefulness.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. T.W. Barbee Jr., Opt. Eng. 25 (1986) p. 989.

    Article  Google Scholar 

  2. T.W. Barbee Jr., in AIP Conf. Proc.75, edited by D.T. Attwood and B.L. Henke (New York, 1986) p. 131.

  3. E. Spiller, in AIP Conf. Proc. 75, edited by D.T. Attwood and B.L. Henke (New York, 1981) p. 124.

  4. M. Born and E. Wolf, Principles of Optics (Pergamon Press, New York, 1983).

    Google Scholar 

  5. E. Spiller, Appl. Opt. 16 (1976) p. 89.

    Google Scholar 

  6. A.M. Saxena and B.P. Schoenborn, Acta Cryst. A33 (1977) p. 805.

    Article  CAS  Google Scholar 

  7. R.W. James, The Optical Principles of the Diffraction of X-Rays (Oxbow Press, Wood-bridge, Conn., 1982).

    Google Scholar 

  8. E. Spiller, Proc. SPIE 563 (1985) p. 367.

    Article  CAS  Google Scholar 

  9. B.L. Henke, P. Lee, T.J. Tanaka, R.L. Shimabukuro, and B.K. Fujikawa, At. Data Nucl. Data Tables 27 (1982) p. 1.

    Article  CAS  Google Scholar 

  10. J.H. Underwood and T.W. Barbee Jr., in AIP Conf. Proc. 75, edited by D.T. Attwood and B.L. Henke (New York, 1981) p. 170.

  11. A.E. Rosenbluth, PhD Thesis, University of Rochester (1982).

  12. A.E. Rosenbluth, Revue Phys. Appl. 23 (1988) p. 1599.

    Article  Google Scholar 

  13. T.W. Barbee Jr., “Multilayers for X-Ray Optical Applications” in X-Ray Microscopy, edited by G. Schmahl and D. Rudolph (Springer-Verlag, Berlin, 1984) p. 144.

    Chapter  Google Scholar 

  14. A.V. Vinogradov and B.Y. Zeldovich, Appl. Opt. 16 (1977) p. 89.

    Article  CAS  Google Scholar 

  15. L.G. Parratt, Phys. Rev. 95 (1954) p. 359.

    Article  Google Scholar 

  16. A.E. Rosenbluth and J.M. Forsyth, A.I.P. Proc. 75 (1981) p. 131.

    Google Scholar 

  17. E. Spiller and A.E. Rosenbluth, Opt. Eng. 25 (1986) p. 954.

    Article  CAS  Google Scholar 

  18. E. Spiller, Revue Phys. Appl. 23 (1988) p. 1687.

    Article  CAS  Google Scholar 

  19. L. Nevot, B. Pardo, and J. Corno, Revue Phys. Appl. 23 (1988) p. 1675.

    Article  Google Scholar 

  20. L.V. Azaroff, R. Kaplow, N. Kato, R.J. Weiss, A.J.C. Wilson, and R.A. Young, X-Ray Diffraction (McGraw Hill, New York, 1974) p. 101.

    Google Scholar 

  21. D.B. McWhan ### in Synthetic Modulated Structures, edited by L.C. Chang and B.C. Giessen (Academic Press, New York, 1988) p. 45.

    Google Scholar 

  22. W. Sevenhaus, M. Gijs, Y. Bruynseraede, H. Homma, and I.K. Schuller, Phy. Rev. B 34 (1986) p. 5955.

    Article  Google Scholar 

  23. B.M. Clemens and J.G. Gay, Phys. Rev. B 35 (1987) p. 9337.

    Article  CAS  Google Scholar 

  24. J.P. Chauvineau, Revue Phys. Appl. 23 (1988) p. 1645.

    Article  CAS  Google Scholar 

  25. Ph. Houdy, Revue Phys. Appl. 23 (1988) p. 1653.

    Article  CAS  Google Scholar 

  26. M. Arbaoui, R. Barchewitz, C. Sella, and K.B. Youn, “Absolute Reflectivity Measurements at 44.79 Å of Sputter Deposited Multilayer X-Ray Mirrors,” to be published in Appl. Opt.

  27. B.W. Dodson, Phys. Rev. B 36 (1987) p. 1068.

    Article  CAS  Google Scholar 

  28. T. Ohmi, T. Ichikawa, T. Shibata, and H. Iwabuchi, Appl. Phys. Lett. 54 (1989) p. 523.

    Article  CAS  Google Scholar 

  29. G.P. Chambers and B.D. Sartwell, “Growth Modes of Ag Deposited on Si(111) with Simultaneous Ion Bombardment,” to be published in Surface Science.

  30. E. Spiller, Appl. Phys. Lett. 54 (1989) p. 2293.

    Article  CAS  Google Scholar 

  31. J.H. Underwood, M.E. Bruner, B.M. Hansch, W.A. Brown, and L.W. Acton, Science 238 (1987) p. 61.

    Article  CAS  Google Scholar 

  32. A.B.C. Walker Jr., T.W. Barbee Jr., R.B. Hoover, and J.F. Lindblom, Science 241 (1988) p. 1781.

    Article  Google Scholar 

  33. A.B.C. Walker Jr., J.F. Lindblom, R.B. Hoover, and T.W. Barbee Jr., “Narrow Band X-Ray EUV Images of the Sun with Normal Incidence Multilayer Optics,” presented at the 9th International Conference on Vacuum Ultraviolet Radiation Physics, July, 1989; to be published in Physica Scripta.

  34. T.W. Barbee Jr., P. Pianetta, R. Redaelli, R. Tatchyn, and T.W. Barbee III, Appl. Phys. Lett. 50 (1987) p. 1841.

    Article  CAS  Google Scholar 

  35. T.W. Barbee Jr., LLNL Energy and Technology Review, Report No. UCRL-5200-87-11.12 (Nov.–Dec, 1987) p. 44.

  36. A. Smith, C. Riedel, B. Edwards, D. Savage, B. Lai, A. Ray-Chaudhuri, F. Cerrina, M. Lagally, J. Underwood, and C. Falco, SPIE 984 (1988) p. 31.

    CAS  Google Scholar 

  37. T.W. Barbee Jr., Rev. Sci. Instr. 60 (1989) p. 1588.

    Article  CAS  Google Scholar 

  38. J.C. Rife, NRL Memorandum Report 6278 (1988).

  39. J.C. Rife, T.W. Barbee Jr., W.R. Hunter, and R.G. Cruddace, Appl. Opt. 28 (1989) p. 2984.

    Article  CAS  Google Scholar 

  40. J.C. Rife, T.W. Barbee Jr., W.R. Hunter, and R.G. Cruddace, “Performance of a Tungsten/Carbon Multilayer-Coated, Blazed Grating from 80 to 1700 eV,” presented at the 9th International Conference on Vacuum Ultraviolet Physics, Hawaii, USA (July 1989); to be published in Physica Scripta.

  41. R.G. Cruddace, T.W. Barbee Jr., J.C. Rife, and W.R. Hunter, “Measurements of the Normal-Incidence X-Ray Reflectance of a Molybdenum-Silicon Multilayer Deposited on a 2000 1/mm Grating,” presented at the 9th International Conference on Vacuum Ultraviolet Radiation Physics, Hawaii, USA (July 1989), to be published in Physica Scripta.

Download references

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Barbee, T.W. Multilayer Optics for the Soft X-Ray and Extreme Ultraviolet. MRS Bulletin 15, 37–44 (1990). https://doi.org/10.1557/S0883769400060449

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/S0883769400060449

Navigation