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Imaging with Surface Spectroscopies

  • Imaging in Materials Science
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References

  1. D. Briggs and M.P. Seah, Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy (John Wiley, New York, 1983).

    Google Scholar 

  2. A. Benninghoven, F.G. Rudenauer, and H.W. Werner, Secondary Ion Mass Spectroscopy (Wiley-Interscience, New York, 1987).

    Google Scholar 

  3. M.J. Kelley, CHEMTECH 17 (1987) (1) p. 30, (2) p. 98, (3) p. 170, (4) p. 232, (5) p. 294, (8) p. 490, (10) p. 632.

    Google Scholar 

  4. P. Eisenberger, J.M. Newsam, M. Leonowicz, and D.E.W. Vaugh; Nature 309 (London, 1984) p. 45.

    Article  CAS  Google Scholar 

  5. J.C. Vickerman, Spectroscopy of Surfaces, edited by R.J.H. Clark and R.E. Hester (John Wiley, New York, 1988) p. 155.

    Google Scholar 

  6. A.J. Eccles and J.C. Vickerman, J. Vac. Sci. Technol. A7 (1989) p. 234.

    Article  Google Scholar 

  7. P. Coxon, J. Krizek, M. Humpherson, and I.R.M. Wardell; J. Elect. Spectros. Rel. Phen. 52 (1990) p. 821.

    Article  CAS  Google Scholar 

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Kelley, M.J. Imaging with Surface Spectroscopies. MRS Bulletin 16, 46–49 (1991). https://doi.org/10.1557/S0883769400057407

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