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High Resolution Z-Contrast Imaging of Semiconductor Interfaces

  • Imaging in Materials Science
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Authors
  1. D. E. Jesson
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  2. S. J. Pennycook
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Jesson, D.E., Pennycook, S.J. High Resolution Z-Contrast Imaging of Semiconductor Interfaces. MRS Bulletin 16, 34–40 (1991). https://doi.org/10.1557/S0883769400057389

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