References
G. Binnig, C.F. Quate, and C. Gerber, Phys. Rev. Lett. 56 (1986) p. 930.
C.M. Mate, G.M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. 59 (1987) p. 1942.
N.A. Burnham and R.J. Colton, J. Vac. Sci. Technol. A 7 (1989) p. 2906.
H.K. Wickramasinghe, Sci. Am. (October, 1989) p. 98.
Y. Martin, C.C. Williams, and H.K. Wickramasinghe, J. Appl. Phys. 61 (1989) p. 4723. G.M. McClelland, R. Erlandsson, and S. Chiang, in Review of Progress in Quantitative Non-Destructive Evaluation 6B, edited by D.O. Thompson and D.E. Chimenti (Plenum, New York, 1987) p. 1307.
T.R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69 (1991) p. 668.
U. Dürig, O. Züger, and A. Stalder, J. Appl. Phys. 72 (1992) p. 1778.
E. Meyer, H. Heinzelmann, P. Grütter, T. Jung, T. Weisskopf, H.R. Hidber, R. Lapka, H. Rudin, and H-J. Güntherodt, J. Microscopy 151 (1988) p. 269.
A.L. Weisenhorn, P.K. Hansma, T.R. Albrecht, and C.F. Quate, Appl. Phys. Lett. 54 (1989) p. 2651.
For recent reviews see, for example, P.K. Hansma, V.B. Elings, O. Marti, and C.E. Bracker, Science 242 (1988) p. 157; H.K. Wickramasinghe, Sci. Am. (October, 1989); H. Heinzelmann, E. Meyer, H. Rudin, and H-J. Güntherodt, in Scanning Tunneling Microscopy and Related Methods, edited by R.J. Behmet et al. (Kluwer Academic Publishers, 1990); D. Rugar and P. Hansma, Phys. Today, October (1990); E. Meyer and H. Heinzelmann in Scanning Tunneling Microscopy and Related Techniques, edited by R. Wiesendanger and H-J. Güntherodt, (Springer Verlag, Berlin, 1992); J. Frommer and E. Meyer, J. Phys. Cond. Mater. S1 (3) (1991); E. Meyer, Progress in Surface Science (1992).
N.A. Burnham and R.J. Colton, in Scanning Tunneling Microscopy: Theory and Application, edited by D. Bonnell, (VCH Publishers, New York, in press).
E. Meyer, H. Haefke, O. Anderson, and K. Bange, Glastechnische Berichte (1992).
P. Grütter, W. Zimmermann-Edling, and D. Brodbeck, Appl. Phys. Lett. 60 (1992) p. 2741.
E. Meyer, H-J. Güntherodt, H. Haefke, and M. Krohn, Europhys. Lett. 15 (1991) p. 319; H. Haefke, E. Meyer, H-J. Güntherodt, G. Gerth, and M. Krohn, J. Mag. Sci. 35 (1991) p. 290.
S. Blunier, H. Zogg, A.N. Tiwari, R.M. Overney, H. Haefke, P. Buffat, and G. Kostorz, Phys. Rev. Lett. (1992), in press.
G. Meyer and N. Amer, Appl. Phys. Lett. 56 (1990) p. 2100.
F.J. Giessibl and G. Binnig, Ultramicroscopy (1992), in press.
E. Meyer, H. Heinzelmann, H. Rudin, and H-J. Güntherodt, Z. Phys. B 79 (1990) p. 3.
L. Bourdieu, P. Silberzan, and D. Chatenay, Phys. Rev. Lett. 67 (1991) p. 2029.
W. Zhong, G. Overney, and D. Tomanek, Europhys. Lett. 15 (1991) p. 49.
U. Landman, W.D. Luedtke, N.A. Burnham, and R.J. Colton, Science 248 (1990) p. 454.
R.M. Feenstra, J.A. Stroscio, J. Tersoff, A. Fein, Phys. Rev. Lett. 58 (1990) p. 1192.
R. Berndt, A. Baratoff, and J.K. Gimzewski, in Scanning Tunneling Microscopy and Related Methods, edited by R.J. Behm et al. (Kluwer Academic Publishers, 1990).
D. Anselmetti, C. Gerber, B. Michel, H-J. Güntherodt, and H. Rohrer, Rev. Sci. Instrum. 63 (1992) p. 3003.
G. Neubauer, S.R. Cohen, G.M. McClelland, D. Horne, and C.M. Mate, Rev. Sci. Instrum. 61 (1990) p. 2296.
G. Meyer and N.M. Amer, Appl. Phys. Lett. 56 (1990) p. 2100; O. Marti, J. Colchero and J. Mlynek, Nanotechnol. 1 (1990) p. 141.
E. Meyer, R. Overney, D. Brodbeck, L. Howald, R. Lüthi, J. Frommer, and H-J. Güntherodt, in Fundamentals in Friction, edited by I. Singer and H. Pollock (Kluwer Academic Publisher, 1992); E. Meyer, R. Overney, J. Frommer, D. Brodbeck, L. Howald, R. Lüthi, H-J. Güntherodt, O. Wolter, M. Fujihira, H. Takano, and Y. Gotoh, Thin Solid Films, in press.
E. Rabinowitz and D. Tabor, Proc. R. Soc. London, Ser. A 208 (1951) p. 455.
S.M. Hsu, MRS Bulletin XVI (10) (1991) p. 54.
E. Meyer, R. Overney, D. Brodbeck, L. Howald, R. Lüthi, J. Frommer, and H-J. Güntherodt, Phys. Rev. Lett. (1992), in press.
R. Overney, E. Meyer, J. Frommer, D. Brodbeck, L. Howald, R. Lüthi, H-J. Güntherodt, M. Fujihira, H. Takano, and Y. Gotoh, Nature (1992), in press.
Scanning Tunneling Microscopy and Related Techniques, edited by R. Wiesendanger and H-J. Güntherodt (Springer Verlag, Berlin, 1992).
J.N. Israelachvili, Intermolecular and Surface Forces (Academic Press, New York, 1986) p. 153.
N.A. Burnham, R.J. Colton, and H.M. Pollock, Nanotechnol., in press.
U. Hartmann, Phys. Rev. B 42 (1990) p. 1541.
A.L. Weisenhorn, P. Maivald, H.J. Butt, and P.K. Hansma, Phys. Rev. B 45 (1992) p. 11226.
N.A. Burnham, R.J. Colton, and H.M. Pollock, J. Vac. Sci. Technol. A 9 (1991) p. 2548.
N.A. Burnham, R.J. Colton, and H.M. Pollock, Phys. Rev. Lett. 69 (1992) p. 144.
C.M. Mate, M.R. Lorenz, and V.J. Novotny, J. Chem Phys. 90 (1989) p. 7550.
N.A. Burnham, D.D. Dominguez, R.L. Mowery, and R.J. Colton, Phys. Rev. Lett. 64 (1990) p. 1931.
R.G. Horn, J.N. Israelachvili, and F. Pribac, J. Coll. Interface. Sci. 115 (1987) p. 480.
G. Sperling, thesis, Karlsruhe Technische Hochschule (1964); K.L. Johnson, K. Kendall, and A.D. Roberts, Proc. R. Soc. London, Ser. A. 324 (1971) p. 301.
B.V. Derjaguin, V.M. Muller, and Y.P. Toporov, J. Coll. Interface Sci. 53 (1975) p. 314.
H. Hertz, J. Reine Angew. Math. 92 (1882) p. 156.
C.A. Brooks, Properties of Diamond (Academic Press, London, 1979).
J.B. Pethica and W.C. Oliver, Physica Scripta T19 (1987) p. 61.
J.B. Pethica and A.P. Sutton, J. Vac. Sci. Technol. A 6 (1988) p. 2494.
J.R. Smith, G. Bozzolo, A. Banerjea, and J. Ferrante, Phys. Rev. Lett. 63 (1989) p. 7269.
P.J. Bryant, H.S. Kim, R.H. Deeken, and Y.C. Cheng, J. Vac. Sci. Technol. A 8 (1990) p. 3502.
G.L. Miller, J.E. Griffith, E.R. Wagner, and D.A. Grigg, Rev. Sci. Instrum. 62 (1991) p. 705.
S.A. Joyce and J.E. Houston, Rev. Sci. Instrum. 62 (1991) p. 710.
R.W. Basedow and T.D. Cocks, J. Phys. E: Sci. Instrum. 13 (1980) p. 840.
L.E.C. van de Leemput, P.H.H Rongen, B.H. Timmerman, and H. van Kempen, Rev. Sci. Instrum. 62 (1991) p. 989.
S. Vieira, C. De Las Heras, and S. Bourgeal, Ferroelectrics 81 (1988) p. 327.
H.M. Pollock, P. Shufflebottom, and J. Skinner, J. Phys. D: Appl. Phys. 10 (1977) p. 127; H.M. Pollock, J. Phys. D: Appl. Phys. 11 (1978) p. 39.
J.H. Hoh, J.P. Cleveland, C.B. Prater, J.P. Revel, and P.K. Hansma, J. Am. Chem. Soc. 114 (1992) p. 4917.
I.N. Sneddon, Int. J. Eng. Sci. 3 (1965) p. 47.
G.M. Pharr, W.C. Oliver, F.R. Brotzen, J. Mater. Res. 7 (1992) p. 613.
S.M. Hues, C.F. Draper, and R.J. Colton, to be published.
J.B. Pethica, R. Hutchings, and W.C. Oliver, Philos. Mag. A 48 (1983) p. 593.
N. Gane, Proc. R. Soc. London, Ser. A 317 (1970) p. 367.
J.D. Pethica and D. Tabor, Surf. Sci. 89 (1979) p. 182.
G.A.D Briggs, J.M. Rowe, A.M. Sinton, and D.S. Spenser, Proc. IEEE Ultrason. Symp. (1988) p. 743.
B. Castagnede, J.T. Jenkins, and W. Sachse, J. Appl. Phys. (1990) p. 2753.
J. Heil, J. Wesner, and W. Grill, J. Appl. Phys. 64 (1988) p. 1939.
W. Rohrbeck, E. Chilla, H-J. Fröhlich, and J. Riedel, Appl. Phys. A 52 (1991) p. 344.
J.A. Harrison, R.J. Colton, C.T. White, and D.W. Brenner, Surf. Sci. 271 (1992) p. 57.
H. Rafii-Tabar, J.B. Pethica, and A.P. Sutton, in Thin Films: Stresses and Mechanical Properties III, edited by W.D. Nix, J.C. Bravman, E. Arzt, and L.B. Freund (Mater. Res. Soc. Symp. Proc. 239, Pittsburgh, PA, 1991) p. 313.
J.A. Harrison, R.J. Colton, C.T. White, and D.W. Brenner, in Thin Films: Stresses and Mechanical Properties III, edited by W.D. Nix, J.C. Bravman, E. Arzt, and L.B. Freund (Mater. Res. Soc. Symp. Proc. 239, Pittsburgh, PA, 1991) p. 573.
J.A. Harrison, D.W. Brenner, C.T. White, and R.J. Colton, Thin Solid Films 206 (1991) p. 213.
J.A. Nieminen, A.P. Sutton, and J.B. Pethica, Acta. Metall. (1992), in press.
J.A. Harrison, C.T. White, R.J. Colton, and D.W. Brenner, Phys. Rev. B 46 (1992), in press.
Industrial Minerals and Rocks, edited by J.L. Gillson (American Institute of Mining, Metallurgical, and Petroleum Engineering, 1960) p. 551.
Handbook of Materials Science, Vol. III, edited by C.T. Lynch (CRC Press, Cleveland, OH, 1975) p. 160.
Rights and permissions
About this article
Cite this article
Hues, S.M., Colton, R.J., Meyer, E. et al. Scanning Probe Microscopy of Thin Films. MRS Bulletin 18, 41–49 (1993). https://doi.org/10.1557/S088376940004344X
Published:
Issue Date:
DOI: https://doi.org/10.1557/S088376940004344X