Conclusions
This article has reviewed some of the consequences and applications of subsurface atomic displacements in the processing of electronic materials. Under appropriate irradiation conditions, defect production and subsequent migration, agglomeration, and annihilation processes can control amorphization, crystallization, removal of pre-existing defects, superlattice disordering, diffusion, mixing, and phase formation. Despite extensive studies of such processes in recent years, it is somewhat surprising that the controlling defects and their interactions are not well understood. The continued application of MeV irradiation schemes, where the energy deposition density is more uniform with depth, may assist in such a pursuit.
Similar content being viewed by others
References
G. Dearnaley, J.H. Freeman, R.S. Nelson, and J. Stephen, Ion Implantation, (North Holland, Amsterdam) 1973.
N.W. Cheung, C.L. Liang, B.K. Liew, R.H. Mutikainen, and H. Wong, Nucl. Instrum. MethodsB37/38 (1989) p. 941.
S.J. Pearton, Mater. Sci. Reports4 (1990) p. 313.
T.M. Buck, K.A. Pickar, J.M. Poate, and C.M. Hsieh, Appl. Phys. Lett.21 (1992) p. 485.
M. Vos, C. Wu, I.V. Mitchell, T.E. Jackman, J.M. Baribeau, and J. McCaffrey, Appl. Phys. Lett. 58 (1991) p. 951.
D.J. Eaglesham, J.M. Poate, D.C. Jacobson, M. Cerullo, L.M. Pfeiffer, and K. West, Appl. Phys. Lett. 58 (1991) p. 523.
R.J. Schreutelkamp, J.S. Custer, J.R. Leifting, W.X. Lu, and F.W. Saris, Mater. Sci. Rep. 6 (1991) p. 1.
J.S. Williams, R.G. Elliman, W.L. Brown, and T.E. Seidel, Phys. Rev. Lett. 55 (1985) p. 1482.
J.M. Poate et.al., Nucl. Instrum. Methods B55 (1991) p. 533.
L.S. Hung, Q.Z. Hong, and J.W. Mayer, Nucl. Instrum. Methods B37,38 (1989) p. 414.
R.P. Bryan, J.J. Coleman, L.M. Miller, M.E. Givens, R.S. Averback, and J.L. Klatt, Appl. Phys. Lett. 55 (1989) p. 94.
R.J. Schreutelkamp, J.S. Custer, J.R. Liefting, and F.W. Saris, Appl. Phys. Lett. 58 (1991) p. 2827.
J.S. Williams, K.T. Short, R.G. Elliman, M.C. Ridgway, and R. Goldberg, Nucl. Instrum. Methods B48 (1990) p. 431.
See, for example, K.S. Jones, S. Prussin, and E.R. Weber, Appl. Phys. A45 (1988) p. 1.
R.G. Elliman, J. Linnros, and W.L. Brown, in Fundamentals of Beam-Solid Interactions and Transient Thermal Processing, edited by M.J. Aziz, L.E. Rehn, and B. Stritzker (Mater. Res. Soc. Symp. Proc. 100, Pittsburgh, PA, 1988) p. 863.
J. Linnros, R.G. Elliman, and W.L. Brown, J. Mater. Res. 6 (1988) p. 1208.
P. Schultz, C. Jagadish, M.C. Ridgway, R.G. Elliman, and J.S. Williams, Phys. Rev. B44 (1991) p. 9118.
R.G. Elliman, J.S. Williams, W.L. Brown, A. Leiberich, D.A. Maher, and R.V. Knoell, Nucl. Instrum. Methods B19/20 (1987) p. 435.
O.W. Holland, D. Fathy, J. Narayan, and O.S. Oen, Nucl. Instrum. Methods B10/11 (1985) p. 565.
D.G. Beanland, in Ion Implantation and Beam Processing, Chapter 8, edited by J.S. Williams and J.M. Poate (Academic Press, Sydney, 1983).
K.S. Jones and C.J. Santana, J. Mater. Res. 6 (1991) p. 1048.
E. Wendler, W. Wesch, and G. Gotz, Nucl. Instrum. Methods B55 (1991) p. 789.
A.G. Cullis, N.G. Chew, C.R. Whitehouse, D.C. Jacobson, J.M. Poate, and S.J. Pearton Appl. Phys. Lett. 55 (1989) p. 1211.
G.L. Olson and R.A. Roth, Mater. Sci. Rep. 3 (1988) p. 1.
F. Priolo and E. Rimini, Mater. Sci. Rep. 5 (1990) p. 319.
K.A. Jackson, J. Mater. Res. 3 (1988) p. 1218.
J.S. Williams, M.C. Ridgway, R.G. Elliman, J.A. Davies, S.T. Johnson, and G.R. Palmer, Nucl. Instrum. Methods B55 (1991) p. 602.
F. Priolo, J.M. Poate, D.C. Jacobson, J. Linnros, J.L. Batstone, and S.U. Campisano, Appl. Phys. Lett. 52 (1988) p. 1213.
Z.L. Wang, B.Ù. Zhang, Q.T. Zhao, Q. Li, J.R. Liefting, R.J. Schreutelkamp, and F.W. Saris, J. Appl. Phys. (in press, April 15, 1992).
J.J. Alwan, J. Honig, M.E. Favaro, K.J. Beernink, J.L. Klatt, R.S. Averback, J.J. Coleman, and R.P. Bryan, Appl. Phys. Lett. 58 (1991) p. 2058.
R.G. Elliman, M.C. Ridgway, C. Jagadish, S.J. Pearton, F. Ren, J. Lothian, T.R. Fullowan, A. Katz, C.R. Abernathy, and R.F. Kopf, J. Appl. Phys. 71 (1992) p. 1010.
Rights and permissions
About this article
Cite this article
Williams, J.S. Subsurface Processing of Electronic Materials Assisted by Atomic Displacements. MRS Bulletin 17, 47–51 (1992). https://doi.org/10.1557/S0883769400041464
Published:
Issue Date:
DOI: https://doi.org/10.1557/S0883769400041464