Skip to main content
SpringerLink
Log in

Long Wavelength Laser Diode Reliability and Lattice Imperfections

  • Materials Reliability in Microelectronics
  • Published:
MRS Bulletin Aims and scope Submit manuscript

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

References

  1. F.R. Nash, W.B. Joyce, R.L. Hartman, E.I. Gordon, and R.W. Dixon, AT&T Tech. J. 64 (1985) p. 671.

    Google Scholar 

  2. W.B. Joyce, K-Y. Liou, F.R. Nash, P.R. Bossard, and R.L. Hartman, in Reference 1, p. 717.

  3. F.R. Nash, W.J. Sundburg, R.L. Hartman, J.R. Pawlik, D.A. Ackerman, N.K. Dutta, and R.W. Dixon, in Reference 1, p. 809.

  4. F.R. Nash, in Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures, edited by V. Swaminithan, S.J. Pearton, and O. Manasreh (Mater. Res. Soc. Symp. Proc. 184, Pittsburgh, PA, 1990) p. 3.

    Google Scholar 

  5. J.L. Zilko, L.J.P. Ketelsen, Y. Twu, D.P. Wilt, S.G. Napholtz, J.P. Blaha, K.E. Strege, V.G. Riggs, D. L. Van Haren, S.Y. Leung, P.M. Nitzsche, J.A. Long, C.B. Roxlo, G. Przyblek, J. Lopata, M.W. Focht, and L.A. Koszi, IEEE J. Quantum Electron. 25 (10) (1989) p. 2091.

    Google Scholar 

  6. N.K. Dutta, AT&T Tech. J. 68 (1989) p. 5.

    Google Scholar 

  7. W.T. Tsang, E.S. Choa, M.C. Wu, Y.K. Chen, R.A. Logan, S.N.G. Chu, and A.M. Sergent, Appl. Phys. Lett. 60 (1992) p. 2580.

    Google Scholar 

  8. S.N.G. Chu, S. Nakahara, M.E. Twigg, L.A. Koszi, E.J. Flynn, A.K. Chin, B.P. Segner, and W.D. Johnston Jr., J. Appl. Phys. 63 (1988) p. 611.

    Google Scholar 

  9. S.N.G. Chu and S. Nakahara, Appl. Phys. Lett. 56 (1990) p. 434.

    Google Scholar 

  10. S.N.G. Chu and S. Nakahara, Appl. Phys. Lett. 62 (1993) p. 917.

    Google Scholar 

  11. S.N.G. Chu, R.A. Logan, and H. Temkin, J. Appl. Phys. 61 (1987) p. 2434.

    Google Scholar 

  12. S.N.G. Chu, in Reference 4, p. 135.

  13. S.N.G. Chu, S. Nakahara, L.C. Luther, and H.W. Krautter, J. Appl. Phys. 69 (1991) p. 6974.

    Google Scholar 

  14. O. Ueda, in Reference 4, p. 125.

  15. O. Ueda, J. Electrochem. Soc. 135 (1988) p. 11C.

    Google Scholar 

  16. M. Fukuda, Reliability and Degradation of Semiconductor Lasers and LEDs (Artech House, Boston, 1991).

    Google Scholar 

  17. U. Gangert, A.T. Briggs, A.R. Goodwin, and P. Charsley, Inst. Phys. Conf. Ser. 117 (1991) p. 581.

    Google Scholar 

  18. B.C. de Cooman, C.W.T. Bulle-Lieuwma, J. A. de Poorter, and W. Nijman, J. Appl. Phys. 67 (1990) p. 3919.

    Google Scholar 

  19. P.A. Barnes and T.L. Paoli, IEEE J. Quantum Electron. QE-12 (10) (1976) p. 633.

    Google Scholar 

  20. R.W. Dixon, Bell System Tech. J. 55 (1976) p. 973.

    Google Scholar 

  21. T. Murotani, E. Oomura, H. Higuchi, H. Namizaki, and W. Susaki, Electron. Lett. 16 (1980) p. 566.

    Google Scholar 

  22. D.P. Wilt, J. Long, W.C. Dautremont-Smith, M.W. Focht, T.M. Shen, and R.L. Hartman, Electron. Lett. 22 (16) (1986) p. 869.

    Google Scholar 

  23. S.N.G. Chu, AT&T Bell Laboratories, unpublished work.

  24. O. Ueda, K. Wakao, S. Kanija, A. Yamaguchi, S. Isozumi, and I. Umebu,J. Appl. Phys. 58 (1985) p. 3996.

    Google Scholar 

  25. W. Both, G. Erbert, A. Klehr, R. Rimpler, G. Stadermann, and U. Zeimer, IEEE Proc., Vol. 134, Pt. J, No. 1, (1987) p. 95.

    Google Scholar 

  26. H. Imai, M. Morimoto, H. Sudo, I. Fujiwara, and M. Tankusugawa, Appl. Phys. Lett. 33 (1978) p. 1011.

    Google Scholar 

  27. C.H. Henry, P.M. Petroff, R.A. Logan, and F.M. Merrit, J. Appl. Phys. 50 (1979) p. 3721.

    Google Scholar 

Download references

Authors
  1. S. N. G. Chu
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Chu, S.N.G. Long Wavelength Laser Diode Reliability and Lattice Imperfections. MRS Bulletin 18, 43–48 (1993). https://doi.org/10.1557/S0883769400039075

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/S0883769400039075

Search

Navigation