References
H. Esaki, Integrated Ferroelectrics 14 (1997) p. 11.
F. Saurenbach and B.D. Terris, Appl. Phys. Lett. 56 (1990) p. 1703.
R. Luthi, H. Haefke, K-P. Meyer, E. Meyer, L. Howald, and H-J. Guntherodt, J. Appl. Phys. 74 (1993) p. 7461.
A. Correira, J. Massanell, N. Garcia, A.P. Levanyuk, A. Zlatkin, and J. Przeslawski, Appl. Phys. Lett. 68 (1996) p. 2796.
K. Franke, J. Besold, W. Haessler, and C. Seegebarth, Surf. Sci. Lett. 302 (1994) p. L283.
A. Gruverman, O. Auciello, and H. Tokumoto, Appl. Phys. Lett. 69 (1996) p. 3191.
A. Gruverman, O. Auciello, R. Ramesh, and H. Tokumoto, Nanotechnology 8 (1997) p. A38.
L.M. Eng, M. Friedrich, J. Fousek, and P. Gunter, J. Vac. Sci. Technol. B 14 (1996) p. 1191.
J.E. Stern, B.D. Terris, H.J. Mamin, and D. Rugar, Appl. Phys. Lett. 55 (1989) p. 318.
Y. Martin, D.W. Abraham, and H.K. Wickramasinghe, ibid. 52 (1988) p. 1103.
N. Nakatani, jpn. j. Appl. Phys. 18 (1979) p. 491.
V.Y.A. Shur, A.L. Subbotin, and V.P. Kuminov, Ferroelectrics 140 (1993) p. 101.
F. Jona and G. Shirane, Ferroelectric Crystals (Pergamon Press, Oxford, 1977).
H. Bluhm, U.D. Schwarz, K-P. Meyer, and R. Wiesendanger, J. Vac. Sci. Technol. B 14 (1996) p. 1180.
A. Gruverman, O. Auciello, and H. Tokumoto, Integrated Ferroelectrics in press.
H. Birk, J. Glatz-Reichenbach-Li-Jie, E. Schreck, and K. Dransfeld, J. Vac. Sci. Technol. B 9 (1990) p. 1162.
P. Guthner and K. Dransfeld, Appl. Phys. Lett. 61 (1992) p. 1137.
K. Franke and M. Weihnacht, Ferroelectric Lett. 19 (1995) p. 25.
A. Gruverman, O. Auciello, and H. Tokumoto, J. Vac. Sci. Technol. B 14 (1996) p. 602.
O. Auciello, A. Gruverman, and H. Tokumoto, Integrated Ferroelectrics 15 (1997) p. 107.
A. Gruverman, O. Auciello, J. Hatano, and H. Tokumoto, Ferroelectrics 184 (1996) p. 11.
R. Luthi, H. Haefke, W. Gutmannsbauer, E. Meyer, L. Howald, and H-J. Guntherodt, J. Vac. Sci. Technol. B 12 (1994) p. 2451.
H. Haefke, R. Luthi, K-P. Meyer, and H-J. Guntherodt, Ferroelectrics 151 (1994) p. 143.
A. Gruverman, J. Hatano, and H. Tokumoto, Ipn. J. Appl. Phys. 36 (1997) p. 2207.
T. Hase and T. Shiosaki, Ibid. 30 (1991) p. 2159.
J.F. Scott, C.A. Paz de Araujo, and B.M. Melnick, J. Alloys Compounds 211 (1994) p. 451.
J.F. Scott, C.A. Paz de Araujo, H.B. Meadows, L.D. McMillan, and A. Shawabkeh, J. Appl. Phys. 66 (1989) p. 1444.
R. Nasby, J. Schwank, M. Rodgers, and S. Miller, Integrated Ferroelectrics 2 (1992) p. 91.
A. Gruverman, A.S. Prakash, S. Aggarwal, B. Yang, M. Wuttig, H. Tokumoto, O. Auciello, T. Venkatesan, and R. Ramesh, Appl. Phys. Lett in press.
O. Auciello, A. Gruverman, and H. Tokumoto (unpublished manuscript).
R.V. Chamberlain, G. Mozurkewich, and R. Orbach, Phys. Rev. Lett. 52 (1984) p. 867.
W.L. Warren, D. Dimos, B.A. Tuttle, G.E. Pike, and R.W. Schwartz, J. Appl. Phys. 77 (1995) p. 6695.
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Auciello, O., Gruverman, A., Tokumoto, H. et al. Nanoscale Scanning Force Imaging of Polarization Phenomena in Ferroelectric Thin Films. MRS Bulletin 23, 33–42 (1998). https://doi.org/10.1557/S0883769400031444
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DOI: https://doi.org/10.1557/S0883769400031444