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Non-epitaxial, Highly Textured (001) CoPt:B2O3 Composite Films for Perpendicular Recording

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Abstract

We report the non-epitaxial growth of highly textured (001) CoPt:B2O3 nanocomposite thin films that are deposited directly on thermally-oxidized Si wafers. Multilayers of Co/Pt/Co/B2O3 are deposited followed by appropriate thermal processing. The as-deposited films are disordered fcc CoPt phase, and magnetically soft. After annealing, an (001) orientation of CoPt-ordered grains is developed. The texture development is dependent both on the total film thickness and the annealing process. Nearly perfect (001) texture can be obtained in films with thinner initial layer thicknesses. Strong perpendicular anisotropy is shown to be related to this (001) texture.

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Authors and Affiliations

  1. Center for Materials Research and Analysis and Department of Physics and Astronomy, University of Nebraska, Lincoln, Nebraska, 68588-0113, USA

    M. L. Yan, N. Powers & D. J. Sellmyer

Authors
  1. M. L. Yan
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  2. N. Powers
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  3. D. J. Sellmyer
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Yan, M.L., Powers, N. & Sellmyer, D.J. Non-epitaxial, Highly Textured (001) CoPt:B2O3 Composite Films for Perpendicular Recording. MRS Online Proceedings Library 721, 76 (2002). https://doi.org/10.1557/PROC-721-E7.6

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  • DOI: https://doi.org/10.1557/PROC-721-E7.6

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