Abstract
Advanced CVD- and MBE-epitaxy allows processing of very thin epitaxial layers with extremely steep dopant gradients. As steep dopant profiles are very sensitive to temperature treatments, the impact of thermal processing from 800°C to 1000°C on the dopant redistribution in epitaxial layers was investigated.
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References
G.A. Sai-Halasz, M.R. Wordeman, D.P. Kern et al., IEEE Electr. Dev. Lett., 8, 463, (1987).
G.G. Shahidi, J. Warnock, S. Fischer et al., IEEE Electr. Dev. Lett., 14, 466 (1993).
H. Gossner, I. Eisele and L. Risch, Jap. J. Appl. Phys., 33, 2423 (1994).
S.S. Iyer and R.A. Metzger, J. Appl. Phys., 52, 5608 (1981).
TSUPREM-4 Vers. 6, Technology Modeling Associates, Palo Alto, CA.
C. Boit, F. Lau and R. Sittig, Appl. Phys. A, 50, 197 (1990).
T. Y. Tan, 1988 International Electronic Devices and Materials Symposium (edms), Short Course: Semiconductor Defects; Taiwan 1988.
L. Borucki, ‘Modeling the Growth and Annealing of Dislocation Loops’ Numerical Modeling of Processes and Devices for Intergrated Circuits NUPAD IV pp.27, Seattle 1992.
D.G. Deppe, N. Holonyak Jr., K.C. Hsieh, P. Gavrilovic, E. Stutius and J. Williams, Appl. Phys. Lett., 51, 581 (1987).
M.E. Law; IEEE Trans. on Computer Aided Design, CAD-10, 1125 (1991).
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Krautschneider, W.H., Lau, F., Gossner, H. et al. Diffusion Behavior of B-, As- and Sb-Dopants in Thin Epitaxial Layers. MRS Online Proceedings Library 358, 945 (1994). https://doi.org/10.1557/PROC-358-945
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DOI: https://doi.org/10.1557/PROC-358-945