Abstract
Similar phenomena associated with the lateral thickness modulation have been observed in two different types of GaxIn1-x strained layer multiple quantum well structures grown on InP by MOVPE. The thickness modulations were always quasi-periodic and developed anisotropically in the [110] direction. It has been found that lattice distortions were caused by such thickness modulations, resulting probably in overall surface elastic relaxation. Once the thickness modulation had started at some stage of the growth, it would continue in the subsequent layer with approximately the same modulation period and an amplified amplitude. This is attributed to the effect of the lattice deformation at the growth surface on the deposition rate of the subsequent layer. The effect of such factors as the magnitude of strain, the growth temperature and the V/III gas ratio on the onset of the thickness modulation is discussed.
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Zhou, X., Charsley, P., Smith, A.D. et al. The Characteristics of the Lateral Thickness Modulation in Strained Layer GaxIn1-xAs Multiple Quantum Well Structures Grown by MOVPE. MRS Online Proceedings Library 340, 337–342 (1994). https://doi.org/10.1557/PROC-340-337
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DOI: https://doi.org/10.1557/PROC-340-337