Abstract
In this study, we demonstrate the enhancement of n-In0.53Ga0.47A s Schottky barrier height by using a thin (300-1800 Å) p-InP surface layer. An increase in the barrier height of 0.46 eV, making the total barrier height 0.66 eV, was obtained in a Au/p-InP/n-InGaAs structure, resulting in a great reduction of leakage currents. Results of the electrical measurements are summarized in table 1. The barrier height of n- In0.53Ga0.47As was increased from 0.2 eV to 0.66 eV when a 1200-Å-thick p-InP surface layer was employed.
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References
K. Kajiyama, Y. Mizushima, and S. Sakata, Appl. Phys. Lett. 23, 45 (1973).
P. Kordos, M. Marso, R. Meyer and H. Luth, Elctron. Lett. 27, 1759 (1991).
C. Y. Chen, A. Y. Cho, K. Y. Cheng and P. A. Garbinski, Appl. Phys. Lett. 40, 401 (1982).
P. Kordos, M. Marso, R. Mayer, H. Luth, J. Appl. Phys. 72, 2374 (1992).
S. B. Roy and A. N. Daw, Solid State Electron. 25, 169 (1982).
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Yang, B., Chen, J.C. & Choa, F.S. Enhancement of Gold on n-InGaAs Schottky Barrier Height by Using a thin p-InP Layer. MRS Online Proceedings Library 340, 259–263 (1994). https://doi.org/10.1557/PROC-340-259
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DOI: https://doi.org/10.1557/PROC-340-259