Abstract
Indium Tin Oxide (ITO) films were deposited by RF sputtering onto glass and quartz substrates with no external heating. An ITO target containing 10 wt% SnO2 was used for the deposition in a Kurt Lesker PVD75 system, in an atmosphere of 50% O2 + 50% Ar. Post-deposition heat treatments were done on these coatings at 150°C, 300°C and 450°C in an atmosphere of commercial air or argon. The effects of these heat treatments on the microstructure and the properties of the films were evaluated using atomic force microscopy, resistivity measurements, and UV-visible absorption spectroscopy. The heat treatments were observed to significantly affect the properties such as transmittance in the visible region, optical band gap and the electrical resistivity of the films. The main differences are caused by the differences in thermal expansion coefficient of the substrates as compared to the sputtered ITO films.
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References
B. G. Lewis and D. C. Paine, MRS Bulletin 25 (8), 22–27 (2000).
M. Batzill and U. Diebold, Progress in Surface Science 79 (2-4), 47–154 (2005).
B. G. Lewis and D. C. Paine, MRS Bulletin, 22–27 (2000).
R. G. Gordon, MRS Bulletin 25 (8), 52–57 (2000).
Y. Shigesato and D. C. Paine, Applied Physics Letters 62 (11), 1268–1270 (1993).
H. Izumi, T. Ishihara, H. Yoshioka and M. Motoyama, Thin Solid Films 411 (1), 32–35 (2002).
D. C. Paine, T. Whitson, D. Janiac, R. Beresford, C. O. Yang and B. Lewis, Journal of Applied Physics 85 (12), 8445–8450 (1999).
K.-H. Choi, J.-A. Jeong, J.-W. Kang, D.-G. Kim, J. K. Kim, S.-I. Na, D.-Y. Kim, S.-S. Kim and H.-K. Kim, Solar Energy Materials and Solar Cells 93 (8), 1248–1255 (2009).
C. Miller, edited by I. Keithley Instruments (Keithley Instruments, Inc., Cleveland OH, 2000).
J. Tauc, Amorphous and Liquid Semiconductors. (Plenum, New York, 1974).
W. F. Wu and B. S. Chiou, Thin Solid Films 293 (1-2), 244–250 (1997).
CRC Handbook of Chemistry and Physics, 61st Edition. (CRC Press Inc., Boca Raton, 1977).
G. Frank and H. Köstlin, Applied Physics A: Materials Science & Processing 27 (4), 197–206 (1982).
G. B. Gonzalez, T. O. Mason, J. P. Quintana, O. Warschkow, D. E. Ellis, J. H. Hwang, J. P. Hodges and J. D. Jorgensen, Journal of Applied Physics 96 (7), 3912–3920 (2004).
I. Hamberg, C. G. Granqvist, K. F. Berggren, B. E. Sernelius and L. Engström, Physical Review B 30 (6), 3240–3249 (1984).
N. Nadaud, N. Lequeux, M. Nanot, J. Jove and T. Roisnel, Journal of Solid State Chemistry 135 (1), 140–148 (1998).
O. Warschkow, D. E. Ellis, G. B. Gonzalez and T. O. Mason, Journal of the American Ceramic Society 86 (10), 1700–1706 (2003).
O. Warschkow, D. E. Ellis, G. B. Gonzalez and T. O. Mason, Journal of the American Ceramic Society 86 (10), 1707–1711 (2003).
O. Warschkow, L. Miljacic, D. E. Ellis, G. Gonzalez and T. O. Mason, Journal of the American Ceramic Society 89 (2), 616–619 (2006).
P. Erhart, A. Klein, R. G. Egdell and K. Albe, Physical Review B (Condensed Matter) 75 (15), 153205–153201 (2007).
H. Morikawa and M. Fujita, Thin Solid Films 359 (1), 61–67 (2000).
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Joshi, S.M., Book, G.W. & Gerhardt, R.A. Effect of Substrate Type on the Electrical and Optical Properties of Cold-sputtered Indium Tin Oxide Films as a function of Post-deposition Heat Treatment. MRS Online Proceedings Library 1256, 1655 (2010). https://doi.org/10.1557/PROC-1256-N16-55
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DOI: https://doi.org/10.1557/PROC-1256-N16-55