Abstract
The transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.
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Do, Y.N., Ryu, KH. & Hyon, C.K. In situ X-ray Scattering Study of the Formation of Au Nano Crystals During Thermal Annealing. MRS Online Proceedings Library 1027, 704 (2007). https://doi.org/10.1557/PROC-1027-D07-04
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DOI: https://doi.org/10.1557/PROC-1027-D07-04