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Surface Photovoltage Spectroscopy for the Investigation of Perovskite Oxide Interfaces

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Abstract

In the present study, we comparatively investigate the distribution of electronic interface states of three different perovskite oxide interfaces, formed by epitaxial thin films of La0.7Sr0.3MnO3 (LSMO), La0.7Ca0.3MnO3 (LCMO), and La0.7Ce0.3MnO3 (LCeMO) on SrTiO3(100) substrates, in the as-prepared state as well as after an annealing procedure. We find that annealing significantly reduces the number and density of interface trap states. Two different experimental realizations of the surface photovoltage spectroscopy (SPS) technique were employed: an approach based on X-ray photoelectron spectroscopy (XPS), as well as a capacitive method. The advantages and limitations of both methods are critically discussed.

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References

  1. J. M. D. Coey, M. Viret, and S. von Molnár, Adv. Phys. 48, 167 (1997).

    Article  Google Scholar 

  2. A.-M. Haghiri-Gosnet and J.-P. Renard, J. Phys. D: Appl. Phys. 36, R127 (2003).

    Article  CAS  Google Scholar 

  3. M. B. Salamon and M. Jaime, Rev. Mod. Phys. 73, 583 (2001).

    Article  CAS  Google Scholar 

  4. A. P. Ramirez, J. Phys.: Condens. Matter 9, 8171 (1997).

    CAS  Google Scholar 

  5. C. L. Balestra, J. Lagowski, and H. C. Gatos, Surf. Sci. 26, 317 (1971).

    Article  CAS  Google Scholar 

  6. H. C. Gatos and J. Lagowski, J. Vac. Sci. Technol. 10, 130 (1973).

    Article  CAS  Google Scholar 

  7. J. Lagowski, Surf. Sci. 299/300, 92 (1994).

    Article  Google Scholar 

  8. L. Kronik and Y. Shapira, Surf. Sci. Rep. 37, 1 (1999).

    Article  CAS  Google Scholar 

  9. J. Lagowski, P. Edelman, M. Dexter, and W. Henley, Semicond. Sci. Technol. 7, A182 (1992).

    Google Scholar 

  10. S. Teich, S. Grafström, and L. M. Eng, Surf. Sci. 552, 77 (2004).

    Article  CAS  Google Scholar 

  11. A. I. Dedyk, G. D. Loos, M. V. Pavlovskaya, and L. T. Ter-Martirosyan, Phys. Solid State 35, 1564 (1993).

    Google Scholar 

  12. A. A. Demkov, L. R. C. Fonseca, J. Tomfohr, and O. F. Sankey, Mat. Res. Soc. Symp. Proc. 786, E5.6.1 (2004).

    Google Scholar 

  13. S. Kurtin, T. C. McGill, and C. A. Mead, Phys. Rev. Lett. 22, 1433 (1969).

    Article  CAS  Google Scholar 

  14. P. Raychaudhuri, C. Mitra, P. D. A. Mann, and S. Wirth, J. Appl. Phys. 93, 8328 (2003).

    Article  CAS  Google Scholar 

  15. J. R. Sun, C. H. Lai, and H. K. Wong, Appl. Phys. Lett. 85, 37 (2004).

    Article  CAS  Google Scholar 

  16. M. Schlüter, Phys. Rev. B 17, 5044 (1978).

    Article  Google Scholar 

  17. R. Rauer, J. Bäckström, D. Budelmann, M. Kurfiss, M. Schilling, M. Rübhausen, T. Walter, K. Dörr, and S. L. Cooper, Appl. Phys. Lett. 81, 3777 (2002) (LCMO); R. Rauer, unpublished data (LSMO, LCeMO).

    Article  CAS  Google Scholar 

  18. J. G. Mavroides and D.F. Kolesar, J. Vac. Sci. Technol. 15, 538 (1978).

    Article  CAS  Google Scholar 

  19. Y. Yacoby and O. Naveh, Phys. Rev. B 7, 3991 (1973).

    Article  CAS  Google Scholar 

  20. M. H. Hecht, Phys. Rev. B 41, 7918 (1990).

    Article  CAS  Google Scholar 

  21. E. Fefer, Y. Shapira, and I. Balberg, Appl. Phys. Lett. 67, 371 (1995).

    Article  CAS  Google Scholar 

  22. E. Beyreuther, S. Grafström, L. M. Eng, C. Thiele, and K. Dörr, Phys. Rev. B, submitted (2005).

  23. V. E. Henrich, G. Dresselhaus, and H. J. Zeiger, Phys. Rev. B 17, 4908 (1978).

    Article  CAS  Google Scholar 

  24. T. Wolfram, E. A. Kraut, and F. J. Martin, Phys. Rev. B 7, 1677 (1973).

    Article  CAS  Google Scholar 

  25. C. Loppacher, U. Zerweck, S. Teich, E. Beyreuther, T. Otto, S. Grafström, and L. M. Eng, Nanotechnology 16, S1 (2005).

    Article  CAS  Google Scholar 

  26. S. Grafström, J. Appl. Phys. 91, 1717 (2002).

    Article  Google Scholar 

  27. T. Becker, C. Streng, Y. Luo, V. Moshnyaga, B. Damaschke, N. Shannon, and K. Samwer, Phys. Rev. Lett. 89, 237203 (2002).

    Article  CAS  Google Scholar 

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Authors and Affiliations

  1. Institute of Applied Photophysics, Technische Universität Dresden, D-01062, Dresden, Germany

    Elke Beyreuther, Stefan Grafström & Lukas M. Eng

  2. Institute for Metallic Materials, IFW Dresden, D-01171, Dresden, Germany

    Christian Thiele & Kathrin Dörr

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  1. Elke Beyreuther
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  2. Stefan Grafström
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  3. Christian Thiele
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  4. Kathrin Dörr
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  5. Lukas M. Eng
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Correspondence to Elke Beyreuther.

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Beyreuther, E., Grafström, S., Thiele, C. et al. Surface Photovoltage Spectroscopy for the Investigation of Perovskite Oxide Interfaces. MRS Online Proceedings Library 902, 705 (2005). https://doi.org/10.1557/PROC-0902-T07-05

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  • DOI: https://doi.org/10.1557/PROC-0902-T07-05

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