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The effects of humidity and surface free energy on adhesion force between atomic force microscopy tip and a silane self-assembled monolayer film

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Abstract

The relationship between atomic force microscopy probe-sample adhesion force and relative humidity (RH) at five different levels of surface free energy (γs) of an organic self-assembled monolayer (SAM) has been investigated. Different γs levels were achieved by exposing a patterned SiO2/CH3-terminated octyldimethylchlorosilane SAM sample to an ultraviolet (UV)/ozone atmosphere. A model consisting of the Laplace-Kelvin theory for capillary condensation for nanosized probe and probe-sample molecular interaction was derived to describe the adhesion force as a function of RH from 25 to 90% for different SAM γs values. The equations were solved analytically by using an equivalent curvature of the probe tip shape. Experimental results show that the adhesion force increases slightly with RH for nonpolar SAM. However, for polar SAM surfaces, it increases at first, reaches a maximum, and then decreases. Both the rate of increase and the maximum of the adhesion force with humidity are γs-dependent, which is in good agreement with theoretical prediction. The large rise in the adhesion force in this RH range is due to the capillary force.

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Authors and Affiliations

  1. Department of Materials Science and Engineering, National Tsing Hua University, HsinChu, 300, Taiwan

    Chien-Chao Huang & Sanboh Lee

  2. Department of Chemistry, Zhejiang Sci-Tech University, Hangzhou, 310012, China

    Lijiang Chen

  3. Building and Fire Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, 20899, USA

    Xiaohong Gu, Minhua Zhao & Tinh Nguyen

Authors
  1. Chien-Chao Huang
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  2. Lijiang Chen
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  3. Xiaohong Gu
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  4. Minhua Zhao
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  6. Sanboh Lee
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Correspondence to Sanboh Lee.

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Huang, CC., Chen, L., Gu, X. et al. The effects of humidity and surface free energy on adhesion force between atomic force microscopy tip and a silane self-assembled monolayer film. Journal of Materials Research 25, 556–562 (2010). https://doi.org/10.1557/JMR.2010.0060

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  • DOI: https://doi.org/10.1557/JMR.2010.0060

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