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In situ observation of stress evolution in pure tin strip under electromigration using synchrotron radiation x-ray

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Abstract

This investigation elucidates stress evolution in situ in tin strips under electromigration using synchrotron radiation x-ray. Minute variations in stress are determined precisely using intense x-rays. Back stresses gradient with the values of 5.5 and 16.5 MPa/cm, which are induced by the current densities of 1 × 103 and 5 × 103 A/cm2, respectively, are measured directly. The effective diffusivities that include both grain and lattice diffusion at various current densities are determined. The Joule heating is observed, ranging from 5 to 15 °C, according to various current densities passed through the stripes. Results of this study suggest that the protective oxide layer on the surfaces significantly influences the kinetics of stress evolution.

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Authors and Affiliations

  1. Department of Chemical and Materials Engineering, National Central University, Jhongli City, 320, Taiwan

    Albert T. Wu & Ciou-Nan Siao

  2. National Synchrotron Radiation Research Center, Hsinchu, 300, Taiwan

    Ching-Shun Ku & Hsin-Yi Lee

Authors
  1. Albert T. Wu
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  2. Ciou-Nan Siao
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  3. Ching-Shun Ku
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  4. Hsin-Yi Lee
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Correspondence to Albert T. Wu.

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Wu, A.T., Siao, CN., Ku, CS. et al. In situ observation of stress evolution in pure tin strip under electromigration using synchrotron radiation x-ray. Journal of Materials Research 25, 292–295 (2010). https://doi.org/10.1557/JMR.2010.0029

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  • DOI: https://doi.org/10.1557/JMR.2010.0029

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