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Photoelectrochemical evaluation of anatase TiO2 polycrystalline aggregation layers with different crystalline orientations

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Abstract

In order to evaluate the characteristics of photocatalysts such as TiO2, it is important to separately estimate the oxidation and reduction reaction rates, since the overall reaction rate is limited by the rate-determining step. In this study, photoelectrochemical techniques were applied to thin films of crystalline oriented anatase TiO2 with polycrystalline aggregations deposited on the transparent conductive oxide (TCO) glass substrate, fabricated by the electrophoretic deposition (EPD) in a strong magnetic field. The influence of the plane orientation on the photocatalytic reaction rates was discovered for both oxidation and reduction with respect to current through the electrochemical measurements. The maximum photocurrent for the (001) plane orientation is three times higher than that for the (100) plane orientation, and is comparable with that of the random orientation. The rate of the anodic reaction determines the rate of the overall photocatalytic reaction, therefore affecting the photopotential.

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Authors and Affiliations

  1. Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, 305-8571, Japan

    Mamiko Kawakita & Yoshio Sakka

  2. Nano Ceramics Center, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, 305-0047, Japan

    Mamiko Kawakita

  3. Advanced Photovoltaics Center, NIMS, 1-2-1 Sengen, Tsukuba, 305-0047, Japan

    Jin Kawakita

  4. World Premier International Research Center Initiative on Materials anoarchitectonics, NIMS, 1-2-1 Sengen, Tsukuba, 305-0047, Japan

    Tadashi Shinohara

Authors
  1. Mamiko Kawakita
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  2. Jin Kawakita
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  3. Yoshio Sakka
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  4. Tadashi Shinohara
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Kawakita, M., Kawakita, J., Sakka, Y. et al. Photoelectrochemical evaluation of anatase TiO2 polycrystalline aggregation layers with different crystalline orientations. Journal of Materials Research 25, 63–68 (2010). https://doi.org/10.1557/JMR.2010.0002

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  • DOI: https://doi.org/10.1557/JMR.2010.0002

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